TY  - GEN
N2  - Theory of Electroelasticity analyzes the stress, strain, electric field and electric displacement in electroelastic structures such as sensors, actuators and other smart materials and structures. This book also describes new theories such as the physical variational principle and the inertial entropy theory. It differs from the traditional method by using the physical variational principle to derive the governing equations of the piezoelectric material, whereas the Maxwell stress is obtained automatically. By using the inertial entropy theory, the temperature wave equation is obtained very easily. The book is intended for scientists, researchers and engineers in the areas of mechanics, physics, smart material and control engineering as well as mechanical, aeronautical and civil engineering, etc.
DO  - 10.1007/978-3-642-36291-0
DO  - doi
AB  - Theory of Electroelasticity analyzes the stress, strain, electric field and electric displacement in electroelastic structures such as sensors, actuators and other smart materials and structures. This book also describes new theories such as the physical variational principle and the inertial entropy theory. It differs from the traditional method by using the physical variational principle to derive the governing equations of the piezoelectric material, whereas the Maxwell stress is obtained automatically. By using the inertial entropy theory, the temperature wave equation is obtained very easily. The book is intended for scientists, researchers and engineers in the areas of mechanics, physics, smart material and control engineering as well as mechanical, aeronautical and civil engineering, etc.
T1  - Theory of electroelasticity
AU  - Kuang, Zhen-Bang,
CN  - SpringerLink
CN  - TK7872.P54
ID  - 695208
KW  - Piezoelectric materials.
KW  - Electrodynamics.
KW  - Elasticity.
SN  - 9783642362910 
SN  - 3642362915 
TI  - Theory of electroelasticity
LK  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-642-36291-0
UR  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-642-36291-0
ER  -