Fringe 2013 [electronic resource] : 7th International Workshop on Advanced Optical Imaging and Metrology / edited by Wolfgang Osten.
2013
TA1630
Linked e-resources
Linked Resource
Online Access
Details
Title
Fringe 2013 [electronic resource] : 7th International Workshop on Advanced Optical Imaging and Metrology / edited by Wolfgang Osten.
Meeting Name
International Workshop on Advanced Optical Imaging and Metrology (7th : 2013 : Nürtingen, Germany)
ISBN
9783642363597 electronic book
3642363598 electronic book
9783642363580
364236358X
3642363598 electronic book
9783642363580
364236358X
Published
Berlin : Springer, 2013.
Language
English
Description
1 online resource.
Call Number
TA1630
Dewey Decimal Classification
621.367
Summary
In continuation of the FRINGE Workshop Series this Proceeding contains all contributions presented at the 7. International Workshop on Advanced Optical Imaging and Metrology. The FRINGE Workshop Series is dedicated to the presentation, discussion and dissemination of recent results in Optical Imaging and Metrology. Topics of particular interest for the 7. Workshop are: - New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology (digital wavefront engineering, computational imaging, model-based reconstruction, compressed sensing, inverse problems solution) - Application-driven technologies in Optical Imaging and Metrology (high-resolution, adaptive, active, robust, reliable, flexible, in-line, real-time) - High-dynamic range solutions in Optical Imaging and Metrology (from macro to nano) - Hybrid technologies in Optical Imaging and Metrology (hybrid optics, sensor and data fusion, model-based solutions, multimodality) - New optical sensors, imaging and measurement systems (integrated, miniaturized, in-line, real-time, traceable, remote) Special emphasis is put on new strategies, taking into account the active combination of physical modeling, computer aided simulation and experimental data acquisition. In particular attention is directed towards new approaches for the extension of existing resolution limits that open the gates to wide-scale metrology, ranging from macro to nano, by considering dynamic changes and using advanced optical imaging and sensor systems.
Note
Conference proceedings.
Access Note
Access limited to authorized users.
Source of Description
Description based on print version record.
Added Author
Osten, Wolfgang, editor of compilation.
Available in Other Form
Fringe 2013
Linked Resources
Online Access
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Table of Contents
New methods and tools for the generation, acquisition, processing, and evaluation of data in Optical Imaging and Metrology
Application-driven technologies in Optical Imaging and Metrology
High-dynamic range solutions in Optical Imaging and Metrology
Hybrid technologies in Optical Imaging and Metrology
New optical sensors, imaging and measurement systems.
Application-driven technologies in Optical Imaging and Metrology
High-dynamic range solutions in Optical Imaging and Metrology
Hybrid technologies in Optical Imaging and Metrology
New optical sensors, imaging and measurement systems.