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Ellipsometry of functional organic surfaces and films [electronic resource] / Karsten Hinrichs, Klaus-Jochen Eichhorn, editors.

Hinrichs, Karsten.; Eichhorn, Klaus-Jochen.
2014
QC176.8.S8
Available Online
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Title
Ellipsometry of functional organic surfaces and films [electronic resource] / Karsten Hinrichs, Klaus-Jochen Eichhorn, editors.
ISBN
9783642401282 electronic book
3642401287 electronic book
9783642401275
DOI
https://doi.org/10.1007/978-3-642-40128-2
Publication Details
Heidelberg : Springer, 2014.
Language
English
Description
1 online resource (369 pages).
Item Number
10.1007/978-3-642-40128-2 doi
Call Number
QC176.8.S8
Dewey Decimal Classification
535.5/2
530.417 621.3815/2
Summary
Ellipsometry is the method of choice to determin the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in a contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.
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Access limited to authorized users.
Source of Description
Description based on print version record.
Added Author
Hinrichs, Karsten.
Eichhorn, Klaus-Jochen.
Series
Springer series in surface sciences.
Available in Other Form
Ellipsometry of functional organic surfaces and films.
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Biomolecules at surfaces
Smart polymer surfaces and films
Nanostructured surfaces and organic/inorganic hybrids
Thin films of organic semiconductors for OPV, OLEDs and OTFT
Developments in ellipsometric real-time/in-situ monitoring techniques
Infrared brillant light sources for micro-ellipsometric studies of organic films
Collection of optical constants of organic layers.

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