000696777 000__ 03103cam\a2200481Ki\4500 000696777 001__ 696777 000696777 005__ 20230306135619.0 000696777 006__ m\\\\\o\\d\\\\\\\\ 000696777 007__ cr\cnu|||unuuu 000696777 008__ 130925t20132014gw\a\\\\ob\\\\001\0\eng\d 000696777 020__ $$a9783642381775 $$qelectronic book 000696777 020__ $$a3642381774 $$qelectronic book 000696777 020__ $$z9783642381768 000696777 0247_ $$a10.1007/978-3-642-38177-5$$2doi 000696777 035__ $$aSP(OCoLC)ocn858914991 000696777 035__ $$aSP(OCoLC)858914991 000696777 040__ $$aGW5XE$$beng$$erda$$epn$$cGW5XE$$dYDXCP$$dN$T$$dCOO 000696777 049__ $$aISEA 000696777 050_4 $$aTA417.25 000696777 08204 $$a620.1/1272$$223 000696777 1001_ $$aBenediktovich, Andrei,$$eauthor. 000696777 24510 $$aTheoretical concepts of x-ray nanoscale analysis$$h[electronic resource] :$$btheory and applications /$$cAndrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov. 000696777 264_1 $$aHeidelberg :$$bSpringer,$$c[2013?] 000696777 264_4 $$c©2014 000696777 300__ $$a1 online resource (xiii, 318 pages) :$$billustrations (some color). 000696777 336__ $$atext$$btxt$$2rdacontent 000696777 337__ $$acomputer$$bc$$2rdamedia 000696777 338__ $$aonline resource$$bcr$$2rdacarrier 000696777 4901_ $$aSpringer Series in Materials Science,$$x0933-033X ;$$vv.183 000696777 504__ $$aIncludes bibliographical references and index. 000696777 5050_ $$aBasic principles of the interaction between X-rays and matter -- X-ray reflectivity -- High-resolution X-ray diffraction -- Grazing-incidence small-angle X-ray scattering -- Theory of X-ray scattering from imperfect crystals -- X-ray diffraction for evaluation of residual stresses in polycrystals -- Methods of mathematical and physical optimization of X-ray data analysis. 000696777 506__ $$aAccess limited to authorized users. 000696777 520__ $$aThis book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike. 000696777 588__ $$aDescription based on online resource; title from PDF title page (SpringerLink, viewed September 9, 2013). 000696777 650_0 $$aX-rays$$xIndustrial applications. 000696777 650_0 $$aNanostructured materials. 000696777 7001_ $$aFeranchuk, I. D.$$q(Ilya D.),$$eauthor. 000696777 7001_ $$aUlyanenkov, Alexander P.,$$eauthor. 000696777 830_0 $$aSpringer series in materials science ;$$vv.183. 000696777 85280 $$bebk$$hSpringerLink 000696777 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-642-38177-5$$zOnline Access 000696777 909CO $$ooai:library.usi.edu:696777$$pGLOBAL_SET 000696777 980__ $$aEBOOK 000696777 980__ $$aBIB 000696777 982__ $$aEbook 000696777 983__ $$aOnline 000696777 994__ $$a92$$bISE