Theoretical concepts of x-ray nanoscale analysis [electronic resource] : theory and applications / Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov.
Benediktovich, Andrei, author.; Feranchuk, I. D. (Ilya D.), author.; Ulyanenkov, Alexander P., author.
2013
TA417.25
Available Online

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Title
Theoretical concepts of x-ray nanoscale analysis [electronic resource] : theory and applications / Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov.
Author
Benediktovich, Andrei, author.
ISBN
9783642381775 electronic book
3642381774 electronic book
9783642381768
DOI
https://doi.org/10.1007/978-3-642-38177-5
Published
Heidelberg : Springer, [2013?]
Copyright
©2014
Language
English
Description
1 online resource (xiii, 318 pages) : illustrations (some color).
Item Number
10.1007/978-3-642-38177-5 doi
Call Number
TA417.25
Dewey Decimal Classification
620.1/1272
Summary
This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Description based on online resource; title from PDF title page (SpringerLink, viewed September 9, 2013).
Added Author
Feranchuk, I. D. (Ilya D.), author.
Ulyanenkov, Alexander P., author.
Series
Springer series in materials science ; v.183.
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All Resources
Basic principles of the interaction between X-rays and matter
X-ray reflectivity
High-resolution X-ray diffraction
Grazing-incidence small-angle X-ray scattering
Theory of X-ray scattering from imperfect crystals
X-ray diffraction for evaluation of residual stresses in polycrystals
Methods of mathematical and physical optimization of X-ray data analysis.

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