TY  - GEN
T1  - Data analysis and pattern recognition in multiple databases
AU  - Adhikari, Animesh.
AU  - Adhikari, Jhimli.
AU  - Pedrycz, Witold,
VL  - 61
CN  - SpringerLink
CN  - TA1650
ID  - 696883
KW  - Data mining.
KW  - Engineering.
KW  - Optical pattern recognition.
SN  - 9783319034102
SN  - 3319034103
TI  - Data analysis and pattern recognition in multiple databases
LK  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-319-03410-2
UR  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-319-03410-2
ER  -