Frontiers in optical methods [electronic resource] : nano-characterization and coherent control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors.
Shudo, Ken-ichi, editor of compilation.; Katayama, Ikufumui, 1977-, editor of compilation.; Ohno, Shin-ya, editor of compilation.
2014
QC454.R4
Available Online

Linked e-resources

Linked Resource
Online Access

Details

Title
Frontiers in optical methods [electronic resource] : nano-characterization and coherent control / Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno, editors.
ISBN
9783642405945 electronic book
3642405940 electronic book
9783642405938
DOI
https://doi.org/10.1007/978-3-642-40594-5
Published
Heidelberg : Springer, 2014.
Copyright
©2014
Language
English
Description
1 online resource (xii, 228 pages) : illustrations (some color).
Item Number
10.1007/978-3-642-40594-5 doi
Call Number
QC454.R4
Dewey Decimal Classification
535.8/4
Summary
This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Description based on online resource; title from PDF title page (SpringerLink, viewed December 10, 2013).
Added Author
Shudo, Ken-ichi, editor of compilation.
Katayama, Ikufumui, 1977-, editor of compilation.
Ohno, Shin-ya, editor of compilation.
Series
Springer series in optical sciences ; 180. 0342-4111
Linked Resources
Online Access
Record Appears in
Online Resources > Ebooks
All Resources
State-of-Art of Terahertz Science and Technology
Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films
Single Photon Counting and Passive Microscopy of Terahertz Radiation
Coherent Phonons in Carbon Nanotubes
Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation
Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures
Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy
Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring
Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique
Terahertz Light Source Based on Synchrotron Radiation
Terahertz Synchrotron Radiation; Optics and Application
Far-infrared Spectroscopy on Solids under Ultra High Pressures
Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.

Browse Subjects

Show more subjects...

Statistics

from
to
Export