@article{698028,
      author = {Yu, Wenjian, and Wang, Xiren,},
      url = {http://library.usi.edu/record/698028},
      title = {Advanced field-solver techniques for RC extraction of  integrated circuits [electronic resource]  /},
      abstract = {Resistance and capacitance (RC) extraction is an essential  step in modeling the interconnection wires and substrate  coupling effect in nanometer-technology integrated circuits  (IC). The field-solver techniques for RC extraction  guarantee the accuracy of modeling, and are becoming  increasingly important in meeting the demand for accurate  modeling and simulation of VLSI designs. Advanced  Field-Solver Techniques for RC Extraction of Integrated  Circuits presents a systematic introduction to, and  treatment of, the key field-solver methods for RC  extraction of VLSI interconnects and substrate coupling in  mixed-signal ICs. Various field-solver techniques are  explained in detail, with real-world examples to illustrate  the advantages and disadvantages of each algorithm. This  book will benefit graduate students and researchers in the  field of electrical and computer engineering, as well as  engineers working in the IC design and design automation  industries.},
      doi = {https://doi.org/10.1007/978-3-642-54298-5},
      recid = {698028},
      pages = {1 online resource (xv, 246 pages) :},
}