000698028 000__ 03154cam\a2200445Ii\4500
000698028 001__ 698028
000698028 005__ 20230306135809.0
000698028 006__ m\\\\\o\\d\\\\\\\\
000698028 007__ cr\cnu---unuuu
000698028 008__ 140501s2014\\\\gw\a\\\\ob\\\\001\0\eng\d
000698028 0167_ $$a016698050$$2Uk
000698028 020__ $$a9783642542985 $$qelectronic book
000698028 020__ $$a3642542980 $$qelectronic book
000698028 020__ $$z9783642542978
000698028 0247_ $$a10.1007/978-3-642-54298-5$$2doi
000698028 035__ $$aSP(OCoLC)ocn878826800
000698028 035__ $$aSP(OCoLC)878826800
000698028 040__ $$aGW5XE$$beng$$erda$$epn$$cGW5XE$$dUKMGB$$dN$T$$dCOO$$dYDXCP
000698028 049__ $$aISEA
000698028 050_4 $$aTK7874
000698028 08204 $$a621.3815$$223
000698028 1001_ $$aYu, Wenjian,$$eauthor.
000698028 24510 $$aAdvanced field-solver techniques for RC extraction of integrated circuits$$h[electronic resource]  /$$cWenjian Yu, Xiren Wang.
000698028 264_1 $$aHeidelberg :$$bSpringer,$$c2014.
000698028 300__ $$a1 online resource (xv, 246 pages) :$$billustrations
000698028 336__ $$atext$$btxt$$2rdacontent
000698028 337__ $$acomputer$$bc$$2rdamedia
000698028 338__ $$aonline resource$$bcr$$2rdacarrier
000698028 504__ $$aIncludes bibliographical references and index.
000698028 5050_ $$aBasic Field-Solver Techniques for RC Extraction -- Fast Boundary Element Methods for Capacitance Extraction (I) -- Fast Boundary Element Methods for Capacitance Extraction (II) -- Resistance Extraction of Complex 3-D Interconnects -- Substrate Resistance Extraction with Boundary Element Method -- Extracting Frequency-Dependent Substrate Parasitics -- Process Variation Aware Capacitance Extraction -- Statistical Capacitance Extraction Based on Continuous-Surface Geometric Model -- Fast Floating Random Walk Method for Capacitance Extraction -- FRW Based Solver for Chip-Scale Large Structures.
000698028 506__ $$aAccess limited to authorized users.
000698028 520__ $$aResistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering, as well as engineers working in the IC design and design automation industries.
000698028 588__ $$aDescription based on online resource; title from PDF title page (SpringerLink, viewed May 1, 2014).
000698028 650_0 $$aIntegrated circuits$$xDesign.
000698028 650_0 $$aElectric resistance.
000698028 7001_ $$aWang, Xiren,$$eauthor.
000698028 852__ $$bebk
000698028 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-642-54298-5$$zOnline Access
000698028 909CO $$ooai:library.usi.edu:698028$$pGLOBAL_SET
000698028 980__ $$aEBOOK
000698028 980__ $$aBIB
000698028 982__ $$aEbook
000698028 983__ $$aOnline
000698028 994__ $$a92$$bISE