TY  - GEN
AU  - Bauer, Ernst,
CN  - SpringerLink
CN  - TA417.23
DO  - 10.1007/978-1-4939-0935-3
DO  - doi
ID  - 706566
KW  - Materials
KW  - Electron microscopy.
KW  - Low energy electron diffraction.
LK  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-1-4939-0935-3
SN  - 9781493909353
SN  - 1493909355
T1  - Surface microscopy with low energy electrons
TI  - Surface microscopy with low energy electrons
UR  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-1-4939-0935-3
ER  -