000706566 000__ 01378cam\a2200397Ii\4500 000706566 001__ 706566 000706566 005__ 20230306140008.0 000706566 006__ m\\\\\o\\d\\\\\\\\ 000706566 007__ cr\un\nnnunnun 000706566 008__ 140721s2014\\\\nyua\\\\ob\\\\001\0\eng\d 000706566 020__ $$a9781493909353$$qelectronic book 000706566 020__ $$a1493909355$$qelectronic book 000706566 020__ $$z9781493909346 000706566 0247_ $$a10.1007/978-1-4939-0935-3$$2doi 000706566 035__ $$aSP(OCoLC)ocn884264542 000706566 035__ $$aSP(OCoLC)884264542 000706566 040__ $$aGW5XE$$beng$$erda$$epn$$cGW5XE$$dYDXCP 000706566 049__ $$aISEA 000706566 050_4 $$aTA417.23 000706566 08204 $$a620.11$$223 000706566 1001_ $$aBauer, Ernst,$$eauthor. 000706566 24510 $$aSurface microscopy with low energy electrons$$h[electronic resource] /$$cErnst Bauer. 000706566 264_1 $$aNew York, NY :$$bSpringer,$$c2014. 000706566 300__ $$a1 online resource (xix, 496 pages) :$$billustrations (some color) 000706566 336__ $$atext$$btxt$$2rdacontent 000706566 337__ $$acomputer$$bc$$2rdamedia 000706566 338__ $$aonline resource$$bcr$$2rdacarrier 000706566 504__ $$aIncludes bibliographical references and index. 000706566 506__ $$aAccess limited to authorized users. 000706566 650_0 $$aMaterials$$xMicroscopy. 000706566 650_0 $$aElectron microscopy. 000706566 650_0 $$aLow energy electron diffraction. 000706566 85280 $$bebk$$hSpringerLink 000706566 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-1-4939-0935-3$$zOnline Access 000706566 909CO $$ooai:library.usi.edu:706566$$pGLOBAL_SET 000706566 980__ $$aEBOOK 000706566 980__ $$aBIB 000706566 982__ $$aEbook 000706566 983__ $$aOnline 000706566 994__ $$a92$$bISE