TY  - GEN
AU  - Yamada-Kaneta, Hiroshi.
AU  - Sakai, Akira
CN  - QC611.6.D4
ID  - 709396
KW  - Semiconductors
KW  - Physics
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10777688
SN  - 9783038138563
T1  - Defects-recognition, imaging and physics in semiconductors XIVselected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
TI  - Defects-recognition, imaging and physics in semiconductors XIVselected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10777688
VL  - vol. 725
ER  -