000709396 000__ 01844cam\a2200385\i\4500
000709396 001__ 709396
000709396 005__ 20210515100526.0
000709396 006__ m\\\\\o\\d\\\\\\\\
000709396 007__ cr\cn\nnnunnun
000709396 008__ 130417t20122012sz\\\\\\o\\\\\000\0\eng\d
000709396 020__ $$a9783038138563$$qelectronic book
000709396 020__ $$z9783037854426$$qpaperback
000709396 035__ $$a(CaPaEBR)ebr10777688
000709396 035__ $$a(OCoLC)809121077
000709396 040__ $$aCaPaEBR$$beng$$erda$$epn$$cCaPaEBR
000709396 05014 $$aQC611.6.D4$$bI58 2011eb
000709396 1112_ $$aInternational Conference on Defects: Recognition, Imaging and Physics in Semiconductors$$n(14th :$$d2011 :$$cMiyazaki-shi, Japan)
000709396 24510 $$aDefects-recognition, imaging and physics in semiconductors XIV$$h[electronic resource] :$$bselected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan /$$cedited by Hiroshi Yamada-Kaneta and Akira Sakai.
000709396 264_1 $$aDurnten-Zurich ;$$aEnfield, NH :$$bTrans Tech Publications,$$c[2012]
000709396 264_4 $$c©2012
000709396 300__ $$a1 online resource (300 pages).
000709396 336__ $$atext$$2rdacontent
000709396 337__ $$acomputer$$2rdamedia
000709396 338__ $$aonline resource$$2rdacarrier
000709396 4901_ $$aMaterials science forum ;$$vvol. 725
000709396 506__ $$aAccess limited to authorized users.
000709396 588__ $$aDescription based on online resource; title from PDF title page (ebrary, viewed October 31, 2013).
000709396 650_0 $$aSemiconductors$$xDefects$$vCongresses.
000709396 650_0 $$aPhysics$$vCongresses.
000709396 7001_ $$aYamada-Kaneta, Hiroshi.
000709396 7001_ $$aSakai, Akira$$c(Professor of engineering science)
000709396 830_0 $$aMaterials science forum ;$$vv. 725.
000709396 852__ $$bebk
000709396 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10777688$$zOnline Access
000709396 909CO $$ooai:library.usi.edu:709396$$pGLOBAL_SET
000709396 980__ $$aEBOOK
000709396 980__ $$aBIB
000709396 982__ $$aEbook
000709396 983__ $$aOnline