Defects-recognition, imaging and physics in semiconductors XIV [electronic resource] : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
2012
QC611.6.D4 I58 2011eb
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Title
Defects-recognition, imaging and physics in semiconductors XIV [electronic resource] : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.
ISBN
9783038138563 electronic book
9783037854426 paperback
9783037854426 paperback
Published
Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
Copyright
©2012
Language
English
Description
1 online resource (300 pages).
Call Number
QC611.6.D4 I58 2011eb
Access Note
Access limited to authorized users.
Source of Description
Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013).
Series
Materials science forum ; v. 725.
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