000713053 000__ 01154cam\a2200325Ia\4500 000713053 001__ 713053 000713053 005__ 20210515101438.0 000713053 006__ m\\\\\o\\d\\\\\\\\ 000713053 007__ cr\cn\nnnunnun 000713053 008__ 081211s2008\\\\njua\\\\ob\\\\001\0\eng\d 000713053 010__ $$z 2008301306 000713053 020__ $$z9789812797339 000713053 020__ $$z9812797335 000713053 020__ $$z9789812797346 000713053 035__ $$a(CaPaEBR)ebr10688072 000713053 035__ $$a(OCoLC)696629586 000713053 040__ $$aCaPaEBR$$cCaPaEBR 000713053 05014 $$aQH212.E4$$bI52 2008eb 000713053 08204 $$a502.825$$222 000713053 24500 $$aIn-situ electron microscopy at high resolution$$h[electronic resource] /$$ceditor, Florian Banhart. 000713053 260__ $$aHackensack, NJ :$$bWorld Scientific,$$cc2008. 000713053 300__ $$avi, 311 p. :$$bill. (some col.) 000713053 504__ $$aIncludes bibliographical references and index. 000713053 506__ $$aAccess limited to authorized users. 000713053 650_0 $$aElectron microscopy$$xTechnique. 000713053 650_0 $$aHigh resolution electron microscopy. 000713053 7001_ $$aBanhart, Florian. 000713053 852__ $$bebk 000713053 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10688072$$zOnline Access 000713053 909CO $$ooai:library.usi.edu:713053$$pGLOBAL_SET 000713053 980__ $$aEBOOK 000713053 980__ $$aBIB 000713053 982__ $$aEbook 000713053 983__ $$aOnline