000713784 000__ 01474cam\a22003851i\4500 000713784 001__ 713784 000713784 005__ 20210515101553.0 000713784 006__ m\\\\\o\\d\\\\\\\\ 000713784 007__ cr\cn\nnnunnun 000713784 008__ 131101s2005\\\\sz\a\\\\oa\\\\000\0\eng\d 000713784 020__ $$z9783908451112 000713784 020__ $$z3908451116 000713784 020__ $$a9783038130314$$qelectronic book 000713784 035__ $$a(CaPaEBR)ebr10777887 000713784 035__ $$a(OCoLC)868961288 000713784 040__ $$aCaPaEBR$$beng$$erda$$epn$$cCaPaEBR 000713784 05014 $$aQD181.S6$$bD54 2005eb 000713784 24500 $$aDiffusion in silicon$$h[electronic resource] :$$ba seven-year retrospective /$$ceditor: D. J. Fisher. 000713784 264_1 $$aDurnten-Zurich :$$bTrans Tech Publications, Inc.,$$c[2005] 000713784 264_4 $$c©2005 000713784 300__ $$a1 online resource (199 pages) :$$billustrations. 000713784 336__ $$atext$$2rdacontent 000713784 337__ $$acomputer$$2rdamedia 000713784 338__ $$aonline resource$$2rdacarrier 000713784 4901_ $$aDefect and Diffusion Forum ;$$vVol. 241 000713784 506__ $$aAccess limited to authorized users. 000713784 588__ $$aDescription based on online resource; title from PDF title page (ebrary, viewed November 01, 2013). 000713784 650_0 $$aSilicon. 000713784 650_0 $$aSilicon$$xAnalysis. 000713784 650_0 $$aDiffusion. 000713784 7001_ $$aFisher, D. J. 000713784 830_0 $$aDiffusion and defect data.$$nPt. A,$$pDefect and diffusion forum ;$$vv. 241. 000713784 852__ $$bebk 000713784 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10777887$$zOnline Access 000713784 909CO $$ooai:library.usi.edu:713784$$pGLOBAL_SET 000713784 980__ $$aEBOOK 000713784 980__ $$aBIB 000713784 982__ $$aEbook 000713784 983__ $$aOnline