TY  - GEN
AU  - Vanden Heuvel, Lee N.
CN  - TS156
ET  - Third edition.
ID  - 714593
KW  - Quality control
KW  - Industrial accidents
KW  - Critical incident technique.
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=3400321
SN  - 9781931332729
T1  - Root cause analysis handbook :a guide to efficient and effective incident investigation /
TI  - Root cause analysis handbook :a guide to efficient and effective incident investigation /
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=3400321
ER  -