TY  - GEN
AU  - Claverie, A.
CN  - QH212.T7
CY  - Hoboken, N.J. :
CY  - London :
DA  - 2013.
ID  - 719295
KW  - Transmission electron microscopy.
KW  - Nanoelectronics.
KW  - Nanotechnology.
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10653885
PB  - John Wiley &Sons, Inc., ;
PB  - ISTE,
PP  - Hoboken, N.J. :
PP  - London :
PY  - 2013.
SN  - 9781118579039
T1  - Transmission electron microscopy in micro-nanoelectronics
TI  - Transmission electron microscopy in micro-nanoelectronics
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10653885
ER  -