000719804 000__ 01411cam\a22003611i\4500
000719804 001__ 719804
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000719804 007__ cr\cn\nnnunnun
000719804 008__ 131006s2013\\\\enka\\\\ob\\\\001\0\eng\d
000719804 020__ $$a9783527655090$$qelectronic book
000719804 020__ $$z9783527410774
000719804 035__ $$a(CaPaEBR)ebr10762543
000719804 035__ $$a(OCoLC)858655510
000719804 040__ $$aCaPaEBR$$beng$$erda$$epn$$cCaPaEBR
000719804 05014 $$aQC482.S3$$bS82 2014eb
000719804 08204 $$a539.7222$$223
000719804 1001_ $$aStangl, Julian.
000719804 24510 $$aNanobeam x-ray scattering$$h[electronic resource] :$$bprobing matter at the nanoscale /$$cJulian Stangl [and three others].
000719804 264_1 $$aHoboken, New Jersey :$$bJohn Wiley & sons,$$c2013.
000719804 300__ $$a1 online resource (392 pages) :$$billustrations
000719804 336__ $$atext$$2rdacontent
000719804 337__ $$acomputer$$2rdamedia
000719804 338__ $$aonline resource$$2rdacarrier
000719804 504__ $$aIncludes bibliographical references and index.
000719804 506__ $$aAccess limited to authorized users.
000719804 588__ $$aDescription based on online resource; title from PDF title page (ebrary, viewed October 6, 2013).
000719804 650_0 $$aElectron probe microanalysis.
000719804 650_0 $$aNanotechnology.
000719804 650_0 $$aX-rays$$xScattering.
000719804 852__ $$bebk
000719804 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10762543$$zOnline Access
000719804 909CO $$ooai:library.usi.edu:719804$$pGLOBAL_SET
000719804 980__ $$aEBOOK
000719804 980__ $$aBIB
000719804 982__ $$aEbook
000719804 983__ $$aOnline