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Table of Contents
Introduction
From Metrology to Digital Data
Uncertainty, Informaiton and Learning Mechanisms
Randomized Algorithms
Robustness Analysis
Emotional Cognitive Mechanismsfor Embedded Systems
Performance Estimation and Probably Approximately Correct Computation
Intelligent Mechanisms in Embedded Systems
Learning in Nonstationary and Evolving Environments
Fault Diagnosis Systems.
From Metrology to Digital Data
Uncertainty, Informaiton and Learning Mechanisms
Randomized Algorithms
Robustness Analysis
Emotional Cognitive Mechanismsfor Embedded Systems
Performance Estimation and Probably Approximately Correct Computation
Intelligent Mechanisms in Embedded Systems
Learning in Nonstationary and Evolving Environments
Fault Diagnosis Systems.