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000723411 019__ $$a894170482
000723411 020__ $$a9783319091112$$qelectronic book
000723411 020__ $$a3319091115$$qelectronic book
000723411 020__ $$z9783319091105
000723411 0247_ $$a10.1007/978-3-319-09111-2$$2doi
000723411 035__ $$aSP(OCoLC)ocn886380214
000723411 035__ $$aSP(OCoLC)886380214$$z(OCoLC)894170482
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000723411 049__ $$aISEA
000723411 050_4 $$aTK7870
000723411 08204 $$a621.381$$223
000723411 1001_ $$aNatarajan, Dhanasekharan,$$eauthor.
000723411 24510 $$aReliable design of electronic equipment$$h[electronic resource] :$$ban engineering guide /$$cDhanasekharan Natarajan.
000723411 264_1 $$aCham :$$bSpringer,$$c[2014]
000723411 264_4 $$c©2015
000723411 300__ $$a1 online resource (xvii, 150 pages) :$$billustrations
000723411 336__ $$atext$$btxt$$2rdacontent
000723411 337__ $$acomputer$$bc$$2rdamedia
000723411 338__ $$aonline resource$$bcr$$2rdacarrier
000723411 504__ $$aIncludes bibliographical references and index.
000723411 5050_ $$aPreface; Acknowledgments; Contents; About the Author; 1 Overview of Reliability Design; Abstract; 1.1...Design and Development of Electronic Equipment; 1.2...Engineering Reliability in Design and Development; 1.2.1 Reliability Techniques for Design Process; 1.2.2 Reliability Techniques for Development Process; 1.3...Computerized System for Reliability Design; 2 Generic Stress Factors and De-rating; Abstract; 2.1...Introduction; 2.2...Ambient Temperature; 2.3...Surface Temperature; 2.4...Thermal Resistance; 2.5...Junction Temperature; 2.5.1 Computing Junction Temperature; 2.6...Basics of De-rating
000723411 5058_ $$a2.6.1 Need for De-rating2.6.2 Examples of De-rating; 2.6.2.1 De-rating for Power Dissipation; A.1. Assessment Exercises; References; 3 Selection and Application of Components; Abstract; 3.1...Basis of Selection; 3.2...Reliability Needs of Components; 3.2.1 De-rating for Stress Factors; 3.2.2 Application of Components; 3.3...Stress Factors and Application Information; 3.3.1 Integrated Circuits; 3.3.1.1 Stress Factors for De-rating; 3.3.1.2 Application Reliability Information; 3.3.2 Discrete Semiconductor Devices; 3.3.2.1 Stress Factors for De-rating; 3.3.2.2 Application Reliability Information
000723411 5058_ $$a3.3.3 Resistors3.3.3.1 Stress Factors for De-rating; 3.3.3.2 Application Reliability Information; 3.3.4 Capacitors; 3.3.4.1 Stress Factors for De-rating; 3.3.4.2 Application Reliability Information; 3.3.5 Inductors and Transformers; 3.3.5.1 Stress Factors for De-rating; 3.3.5.2 Application Reliability Information; 3.3.6 Connectors; 3.3.6.1 Stress Factors for De-rating; 3.3.6.2 Application Reliability Information; 3.3.7 Switches; 3.3.7.1 Stress Factors for De-rating; 3.3.7.2 Application Reliability Information; 3.3.8 Relays; 3.3.8.1 Stress Factors for De-rating
000723411 5058_ $$a3.3.8.2 Application Reliability Information3.3.9 Fuses; 3.3.9.1 Stress Factors for De-rating; 3.3.9.2 Application Reliability Information; 3.3.10 Coaxial Cables and PCBs; A.1. Assessment Exercises; A.2. Research Assignments; References; 4 Failure Mode and Effects Analysis; Abstract; 4.1...Introduction; 4.2...Significance of FMEA; 4.3...Examples of FMEA in Design ; 4.4...Benefits of FMEA; 4.5...Organizing FMEA; 4.5.1 Planning in Design; 4.5.2 Resources; 4.5.2.1 Software Support; 4.5.3 Assigning FMEA; 4.6...Terms in FMEA ; 4.6.1 Failure Mode; 4.6.2 Failure Effect; 4.6.3 Failure Cause
000723411 5058_ $$a4.6.4 Preventive Actions4.6.5 Characterizing Failure Mode; 4.6.5.1 Unambiguous Failure Modes; 4.6.5.2 Independent Failure Modes; 4.7...FMEA at Module Level ; 4.7.1 Interconnection FMEA; 4.7.2 Library of Preventive Actions; 4.7.3 Maintenance Flow Diagrams; 4.8...FMEA at Component Level; A.1. Assessment Exercises; A.2. Research Assignments; References; 5 Overstress Analysis; Abstract; 5.1...Need for Overstress Analysis; 5.2...Benefits of Overstress Analysis; 5.3...Types of Overstress; 5.3.1 Transient Electrical Overstress; 5.3.2 Operating Electrical Overstress; 5.3.3 Thermal Overstress
000723411 506__ $$aAccess limited to authorized users.
000723411 520__ $$aThis book explains reliability techniques with examples from electronics design for the benefit of engineers. It presents the application of de-rating, FMEA, overstress analyses and reliability improvement tests for designing reliable electronic equipment. Adequate information is provided for designing computerized reliability database system to support the application of the techniques by designers. Pedantic terms and the associated mathematics of reliability engineering discipline are excluded for the benefit of comprehensiveness and practical applications. This book offers excellent support.
000723411 588__ $$aDescription based on online resource; title from PDF title page (SpringerLink, viewed August 11, 2014).
000723411 650_0 $$aElectronic apparatus and appliances$$xReliability.
000723411 650_0 $$aElectronic apparatus and appliances$$xDesign and construction.
000723411 77608 $$iPrint version:$$aNatarajan, Dhanasekharan.$$tReliable Design of Electronic Equipment : An Engineering Guide$$dDordrecht : Springer,c2014$$z9783319091105
000723411 852__ $$bebk
000723411 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-09111-2$$zOnline Access$$91397441.1
000723411 909CO $$ooai:library.usi.edu:723411$$pGLOBAL_SET
000723411 980__ $$aEBOOK
000723411 980__ $$aBIB
000723411 982__ $$aEbook
000723411 983__ $$aOnline
000723411 994__ $$a92$$bISE