000724137 000__ 05466cam\a2200541Ii\4500 000724137 001__ 724137 000724137 005__ 20230306140422.0 000724137 006__ m\\\\\o\\d\\\\\\\\ 000724137 007__ cr\cn\nnnunnun 000724137 008__ 141106t20142015gw\a\\\\ob\\\\001\0\eng\d 000724137 019__ $$a908086206 000724137 020__ $$a9783662445327$$qelectronic book 000724137 020__ $$a3662445328$$qelectronic book 000724137 020__ $$z9783662445310 000724137 035__ $$aSP(OCoLC)ocn894554163 000724137 035__ $$aSP(OCoLC)894554163$$z(OCoLC)908086206 000724137 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dYDXCP$$dOCLCO$$dGW5XE$$dOCLCF$$dN$T$$dIDEBK$$dEBLCP$$dCDX 000724137 049__ $$aISEA 000724137 050_4 $$aQH207$$b.K83 2015 000724137 08204 $$a578.4$$223 000724137 1001_ $$aKuch, Wolfgang,$$eauthor. 000724137 24510 $$aMagnetic microscopy of layered structures$$h[electronic resource] /$$cWolfgang Kuch, Rudolf Schäfer, Peter Fischer, Franz Ulrich Hillebrecht. 000724137 264_1 $$aHeidelberg :$$bSpringer,$$c[2014] 000724137 264_4 $$c©2015 000724137 300__ $$a1 online resource (xi, 246 pages) :$$billustrations (some color). 000724137 336__ $$atext$$btxt$$2rdacontent 000724137 337__ $$acomputer$$bc$$2rdamedia 000724137 338__ $$aonline resource$$bcr$$2rdacarrier 000724137 4901_ $$aSpringer Series in Surface Sciences,$$x0931-5195 ;$$vvolume 57 000724137 504__ $$aIncludes bibliographical references and index. 000724137 5050_ $$aPreface; Acknowledgments; Contents; 1 Introduction; 1.1 Layered Magnetic Structures; 1.1.1 Magnetoresistive Devices; 1.1.2 Spintronics; 1.1.3 Ferromagnetic -- Antiferromagnetic Heterostructures; 1.1.4 Need for Layer-Resolved Information; 1.1.5 Need for Time Resolution; 1.2 Approaches to Layer-Resolved Magnetic Imaging; 1.2.1 Interference-Based Approach; 1.2.2 Electronic Properties-Based Approach; 2 Magneto-Optical Effects; 2.1 Overview; 2.2 Optical Basics of Conventional Effects; 2.2.1 Wave Equation; 2.2.2 Polarized Light; 2.2.3 Birefringence, Dichroism, and Optical Activity 000724137 5058_ $$a2.2.4 The Compensator2.2.5 Reflection and Transmission of Polarized Light; 2.3 Electromagnetic Basics of Conventional Effects ; 2.3.1 The Dielectric Permittivity Tensor; 2.3.2 Solutions; 2.4 Faraday and Kerr Effect ; 2.4.1 Phenomenological Description; 2.4.2 Geometry of the Rotation Effects; 2.4.3 Kerr Contrast and Signal; 2.4.4 Microscopic Origin of the Kerr Effect; 2.5 Voigt Effect; 2.6 Gradient Effect; 2.7 X-Ray Magnetic Dichroism; 2.7.1 X-Ray Magnetic Linear Dichroism; 2.7.2 Circularly Polarized X-rays; 2.7.3 X-Ray Magnetic Circular Dichroism 000724137 5058_ $$a3 Depth-Sensitive Conventional Magneto-Optical Microscopy3.1 Magneto-Optical Microscopy and Magnetometry; 3.1.1 Wide-Field Microscopy; 3.1.2 Laser-Scanning Microscopy; 3.1.3 Magneto-Optical Magnetometry and Ellipsometry; 3.2 Depth Sensitivity of Conventional Magneto-Optics; 3.2.1 Experimental Proof of Depth Sensitivity; 3.2.2 Theoretical Approaches to Depth Sensitivity in Magneto-Optics; 3.2.3 Depth Sensitivity Function; 3.2.4 Depth Sensitivity in Magnetic Films; 3.2.5 Depth Sensitivity in Magnetic Multilayers; 3.2.6 Depth Selectivity in Magnetic Multilayers 000724137 5058_ $$a3.3 Depth-Selective Kerr Microscopy3.4 Voigt- and Gradient Microscopy; 4 Depth-Sensitive Photoelectron Emission Microscopy; 4.1 Photoelectron Emission Microscopy; 4.2 Electron Yield Detection of Absorption from Buried Layers; 4.3 Imaging Ferromagnetic Materials by X-ray Magnetic Circular Dichroism; 4.3.1 NiFe/Cu/Co Trilayers; 4.3.2 Co/Cu/Ni Trilayers; 4.3.3 NiFe/Al2O3/Co Trilayers; 4.3.4 Ni/Fe/Co Trilayers; 4.3.5 Ni/FeMn/Co Trilayers; 4.4 Imaging Antiferromagnetic Materials by X-ray Magnetic Linear Dichroism 000724137 5058_ $$a4.4.1 Magnetic Linear Dichroism as Contrast Mechanism for Layer-Resolved Magnetic Imaging Using PEEM4.4.2 Exchange Coupling at the Interface of NiO and a Ferromagnetic Metal; 4.4.3 CoO/NiO Heterostructures; 4.4.4 Co/LaFeO3 Heterostructures; 4.5 Time- and Layer-Resolved Magnetic Imaging by XMCD-PEEM; 5 Magnetic Transmission Soft X-Ray Microscopy; 5.1 Introduction; 5.2 Absorption of X Rays in Transmission Experiments ; 5.3 Basic Elements in Magnetic Transmission Soft X-Ray Microscopy ; 5.3.1 Fresnel Zone Plates as Optical Elements ; 5.3.2 Experimental Set-Up; 5.3.3 Sample Properties 000724137 506__ $$aAccess limited to authorized users. 000724137 520__ $$aThis book presents the important analytical technique of magnetic microscopy. This method is applied to analyze layered structures with high resolution. This book presents a number of layer-resolving magnetic imaging techniques that have evolved recently. Many exciting new developments in magnetism rely on the ability to independently control the magnetization in two or more magnetic layers in micro- or nanostructures. This in turn requires techniques with the appropriate spatial resolution and magnetic sensitivity. The book begins with an introductory overview, explains then the principles o. 000724137 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed December 17, 2014). 000724137 650_0 $$aMicroscopy$$xTechnique. 000724137 7001_ $$aSchäfer, Rudolf,$$eauthor. 000724137 7001_ $$aFischer, Peter,$$eauthor. 000724137 7001_ $$aHillebrecht, Franz Ulrich,$$eauthor. 000724137 77608 $$iPrint version:$$aKuch, Wolfgang$$tMagnetic Microscopy of Layered Structures$$dBerlin, Heidelberg : Springer Berlin Heidelberg,c2014$$z9783662445310 000724137 830_0 $$aSpringer series in surface sciences ;$$vvolume 57. 000724137 852__ $$bebk 000724137 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-44532-7$$zOnline Access$$91397441.1 000724137 909CO $$ooai:library.usi.edu:724137$$pGLOBAL_SET 000724137 980__ $$aEBOOK 000724137 980__ $$aBIB 000724137 982__ $$aEbook 000724137 983__ $$aOnline 000724137 994__ $$a92$$bISE