TY  - GEN
T1  - Circuit design for reliability
AU  - Reis, Ricardo A. L.
AU  - Cao, Yu
AU  - Wirth, Gilson,
CN  - TK7874
ID  - 724230
KW  - Integrated circuits
KW  - Integrated circuits
SN  - 9781461440789
SN  - 1461440785
TI  - Circuit design for reliability
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-1-4614-4078-9
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-1-4614-4078-9
ER  -