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000724230 020__ $$a9781461440789$$qelectronic book
000724230 020__ $$a1461440785$$qelectronic book
000724230 020__ $$z9781461440772
000724230 035__ $$aSP(OCoLC)ocn894893521
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000724230 24500 $$aCircuit design for reliability$$h[electronic resource] /$$cRicardo Reis, Yu Cao, Gilson Wirth, editors.
000724230 264_1 $$aNew York, NY :$$bSpringer,$$c[2014]
000724230 264_4 $$c©2015
000724230 300__ $$a1 online resource (vi, 272 pages) :$$billustrations (some color)
000724230 336__ $$atext$$btxt$$2rdacontent
000724230 337__ $$acomputer$$bc$$2rdamedia
000724230 338__ $$aonline resource$$bcr$$2rdacarrier
000724230 506__ $$aAccess limited to authorized users.
000724230 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed December 3, 2014).
000724230 650_0 $$aIntegrated circuits$$xDesign and construction.
000724230 650_0 $$aIntegrated circuits$$xReliability.
000724230 7001_ $$aReis, Ricardo A. L.$$q(Ricardo Augusto da Luz),$$eeditor.
000724230 7001_ $$aCao, Yu$$c(Computer scientist),$$eeditor.
000724230 7001_ $$aWirth, Gilson,$$eeditor.
000724230 852__ $$bebk
000724230 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-1-4614-4078-9$$zOnline Access$$91397441.1
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000724230 980__ $$aEBOOK
000724230 980__ $$aBIB
000724230 982__ $$aEbook
000724230 983__ $$aOnline
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