Probing crystal plasticity at the nanoscales [electronic resource] : synchrotron x-ray microdiffraction / Arief Suriadi Budiman.
2015
QD933 .B83 2015eb
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Title
Probing crystal plasticity at the nanoscales [electronic resource] : synchrotron x-ray microdiffraction / Arief Suriadi Budiman.
ISBN
9789812873354 electronic book
981287335X electronic book
9789812873347
981287335X electronic book
9789812873347
Published
Singapore : Springer, 2015.
Language
English
Description
1 online resource (ix, 118 pages) : illustrations (some color).
Item Number
10.1007/978-981-287-335-4 doi
Call Number
QD933 .B83 2015eb
Dewey Decimal Classification
548/.8
Summary
This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars. When crystalline materials are mechanically deformed in small volumes, higher stresses are needed for plastic flow. This has been called the "Smaller is Stronger" phenomenon and has been widely observed. studies suggest that plasticity in one case is indeed controlled by the GNDs (strain gradient hardening), whereas in the other, plasticity is not controlled by strain gradients or sub-structure hardening, but rather by dislocation source starvation, wherein smaller volumes are stronger because fewer sources of dislocations are available (dislocation starvation hardening).
Bibliography, etc. Note
Includes bibliographical references.
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Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed January 12, 2015).
Series
SpringerBriefs in applied sciences and technology.
Available in Other Form
Print version: 9789812873347
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Table of Contents
From the Contents: Introduction
Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab
Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.
Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab
Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence.