000725642 000__ 03469cam\a2200481Ii\4500 000725642 001__ 725642 000725642 005__ 20230306140650.0 000725642 006__ m\\\\\o\\d\\\\\\\\ 000725642 007__ cr\cn\nnnunnun 000725642 008__ 150216s2015\\\\sz\a\\\\ob\\\\001\0\eng\d 000725642 019__ $$a908048097 000725642 020__ $$a9783319118246$$qelectronic book 000725642 020__ $$a3319118242$$qelectronic book 000725642 020__ $$z9783319118239 000725642 0247_ $$a10.1007/978-3-319-11824-6$$2doi 000725642 035__ $$aSP(OCoLC)ocn903489039 000725642 035__ $$aSP(OCoLC)903489039$$z(OCoLC)908048097 000725642 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dGW5XE$$dDKU$$dN$T$$dUPM$$dIDEBK$$dCOO$$dOCLCF$$dCDX$$dE7B$$dEBLCP$$dOCLCO$$dYDXCP 000725642 049__ $$aISEA 000725642 050_4 $$aTK7874 000725642 08204 $$a621.3815/48$$223 000725642 1001_ $$aTehranipoor, Mark,$$eauthor. 000725642 24510 $$aCounterfeit integrated circuits$$h[electronic resource] :$$bdetection and avoidance /$$cMark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte. 000725642 264_1 $$aCham :$$bSpringer,$$c2015. 000725642 300__ $$a1 online resource (xx, 269 pages) :$$billustrations. 000725642 336__ $$atext$$btxt$$2rdacontent 000725642 337__ $$acomputer$$bc$$2rdamedia 000725642 338__ $$aonline resource$$bcr$$2rdacarrier 000725642 504__ $$aIncludes bibliographical references and index. 000725642 5050_ $$aIntroduction -- Conterfeit Integrated Circuits -- Counterfeit Defects -- Physical Tests for Counterfeit Detection -- Electrical Tests for Counterfeit Detection -- Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods -- Advanced Detection: Physical Tests -- Advanced Detection: Electrical Tests -- Combating Die and IC Recycling -- Hardware IP Watermarking -- Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly -- Chip ID. 000725642 506__ $$aAccess limited to authorized users. 000725642 520__ $$aThis timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. ℗ℓThe authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs).℗ℓ Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. ℗ℓ ℗ʺ℗ℓ℗ℓ℗ℓ℗ℓ℗ℓ℗ℓHelps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; ℗ʺ℗ℓ℗ℓ℗ℓ℗ℓ℗ℓ Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; ℗ʺ℗ℓ℗ℓ℗ℓ℗ℓ℗ℓ Provides step-by-step solutions for detecting different types of counterfeit ICs; ℗ʺ℗ℓ℗ℓ℗ℓ℗ℓ℗ℓ Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government. 000725642 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed February 17, 2015). 000725642 650_0 $$aIntegrated circuits$$xTesting. 000725642 650_0 $$aIntegrated circuits$$xVerification. 000725642 650_0 $$aProduct counterfeiting. 000725642 7001_ $$aGuin, Ujjwal,$$eauthor. 000725642 7001_ $$aForte, Domenic,$$eauthor. 000725642 77608 $$iPrint version:$$z9783319118239 000725642 852__ $$bebk 000725642 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-11824-6$$zOnline Access$$91397441.1 000725642 909CO $$ooai:library.usi.edu:725642$$pGLOBAL_SET 000725642 980__ $$aEBOOK 000725642 980__ $$aBIB 000725642 982__ $$aEbook 000725642 983__ $$aOnline 000725642 994__ $$a92$$bISE