TY  - GEN
AB  - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
AU  - Voigtländer, Bert,
CN  - QH212.S33
DO  - 10.1007/978-3-662-45240-0
DO  - doi
ID  - 725791
KW  - Scanning probe microscopy.
KW  - Atomic force microscopy.
KW  - Scanning tunneling microscopy.
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-45240-0
N2  - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
SN  - 9783662452400
SN  - 3662452405
T1  - Scanning probe microscopyatomic force microscopy and scanning tunneling microscopy /
TI  - Scanning probe microscopyatomic force microscopy and scanning tunneling microscopy /
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-45240-0
ER  -