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000725791 019__ $$a908097786
000725791 020__ $$a9783662452400$$qelectronic book
000725791 020__ $$a3662452405$$qelectronic book
000725791 020__ $$z9783662452394
000725791 0247_ $$a10.1007/978-3-662-45240-0$$2doi
000725791 035__ $$aSP(OCoLC)ocn904046390
000725791 035__ $$aSP(OCoLC)904046390$$z(OCoLC)908097786
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000725791 049__ $$aISEA
000725791 050_4 $$aQH212.S33$$bV65 2015eb
000725791 08204 $$a502.82$$223
000725791 1001_ $$aVoigtländer, Bert,$$eauthor.
000725791 24510 $$aScanning probe microscopy$$h[electronic resource] :$$batomic force microscopy and scanning tunneling microscopy /$$cBert Voigtländer.
000725791 264_1 $$aHeidelberg :$$bSpringer,$$c[2015]
000725791 264_4 $$c©2015
000725791 300__ $$a1 online resource :$$billustrations.
000725791 336__ $$atext$$btxt$$2rdacontent
000725791 337__ $$acomputer$$bc$$2rdamedia
000725791 338__ $$aonline resource$$bcr$$2rdacarrier
000725791 4901_ $$aNanoScience and technology,$$x1434-4904
000725791 504__ $$aIncludes bibliographical references and index.
000725791 5050_ $$aIntroduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom.
000725791 506__ $$aAccess limited to authorized users.
000725791 520__ $$aThis book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
000725791 588__ $$aDescription based on online resource; title from PDF title page (viewed March 4, 2015).
000725791 650_0 $$aScanning probe microscopy.
000725791 650_0 $$aAtomic force microscopy.
000725791 650_0 $$aScanning tunneling microscopy.
000725791 77608 $$iPrint version:$$z9783662452394
000725791 830_0 $$aNanoscience and technology.
000725791 852__ $$bebk
000725791 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-45240-0$$zOnline Access$$91397441.1
000725791 909CO $$ooai:library.usi.edu:725791$$pGLOBAL_SET
000725791 980__ $$aEBOOK
000725791 980__ $$aBIB
000725791 982__ $$aEbook
000725791 983__ $$aOnline
000725791 994__ $$a92$$bISE