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Surface science tools for nanomaterials characterization [electronic resource] / Challa S.S.R. Kumar, editor.

Kumar, C. S. S. R. (Challa S. S. R.), editor.
2015
QC176.8.N35 S87 2015eb
Available Online
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Title
Surface science tools for nanomaterials characterization [electronic resource] / Challa S.S.R. Kumar, editor.
ISBN
9783662445518 electronic book
3662445514 electronic book
9783662445501
DOI
https://doi.org/10.1007/978-3-662-44551-8
Published
Berlin : Springer, [2015]
Copyright
©2015
Language
English
Description
1 online resource (x, 652 pages) : illustrations.
Item Number
10.1007/978-3-662-44551-8 doi
Call Number
QC176.8.N35 S87 2015eb
Dewey Decimal Classification
620.5
Summary
Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Added Author
Kumar, C. S. S. R. (Challa S. S. R.), editor.
Available in Other Form
Print version: 9783662445501
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Higher Resolution Scanning Probe Methods for Magnetic Imaging
The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials
SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography
Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy
Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
Magnetic Force Microscopy
High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films
FIM-Characterized Tips for SPM
Scanning Conductive Torsion Mode Microscopy
Scanning Probe Acceleration Microscopy (SPAM)
Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures
Field Ion Microscopy (FIM)
Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.

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