Silicon analog components [electronic resource] : device design, process integration, characterization, and reliability / Badih El-Kareh, Lou N. Hutter.
El-Kareh, Badih, author.; Hutter, Lou N., author.
2015
TK7874
Available Online

Linked e-resources

Linked Resource
Online Access
Concurrent users
Unlimited
Authorized users
Authorized users
Document Delivery Supplied
Can lend chapters, not whole ebooks

Details

Title
Silicon analog components [electronic resource] : device design, process integration, characterization, and reliability / Badih El-Kareh, Lou N. Hutter.
Author
El-Kareh, Badih, author.
ISBN
9781493927517 electronic book
1493927515 electronic book
9781493927500
Published
New York, NY : Springer, 2015.
Language
English
Description
1 online resource (xli, 607 pages) : illustrations
Call Number
TK7874
Dewey Decimal Classification
621.3815
Summary
This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors' extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed June 10, 2015).
Added Author
Hutter, Lou N., author.
Linked Resources
Online Access
Record Appears in
Online Resources > Ebooks
All Resources
The World Is Analog
Review of Single-Crystal Silicon Properties
PN Junctions
Rectifying and Ohmic Contacts
Bipolar and Junction Field-Effect Transistors
High-Voltage and Power Transistors
Passive Components
Process Integration
Mismatch and Noise
Chip Reliability.

Browse Subjects

Show more subjects...

Statistics

from
to
Export