Computational forensics [electronic resource] : 5th International Workshop, IWCF 2012, Tsukuba, Japan, November 11, 2012 and 6th International Workshop, IWCF 2014, Stockholm, Sweden, August 24, 2014, Revised selected papers / Utpal Garain, Faisal Shafait (eds.).
2015
HV8073 .I92 2015eb
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Title
Computational forensics [electronic resource] : 5th International Workshop, IWCF 2012, Tsukuba, Japan, November 11, 2012 and 6th International Workshop, IWCF 2014, Stockholm, Sweden, August 24, 2014, Revised selected papers / Utpal Garain, Faisal Shafait (eds.).
Meeting Name
IWCF (Workshop) (5th : 2012 : Tsukuba, Japan)
ISBN
9783319201252 electronic book
3319201255 electronic book
9783319201245
3319201255 electronic book
9783319201245
Published
Cham : Springer, 2015.
Language
English
Description
1 online resource (x, 213 pages) : illustrations.
Item Number
10.1007/978-3-319-20125-2 doi
Call Number
HV8073 .I92 2015eb
Dewey Decimal Classification
363.250285
Summary
This book constitutes the refereed post-conference proceedings of the 5th and 6th International Workshops on Computational Forensics, IWCF 2012 and IWCF 2014, held in Tsukuba, Japan, in November 2010 and August 2014. The 16 revised full papers and 1 short paper were carefully selected from 34 submissions during a thorough review process. The papers are divided into three broad areas namely biometrics; document image inspection; and applications.
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Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed July 1, 2015).
Added Author
Garain, Utpal, editor.
Shafait, Faisal, editor.
Shafait, Faisal, editor.
Added Meeting Name
IWCF (Workshop) (6th : 2014 : Stockholm, Sweden)
Series
Lecture notes in computer science ; 8915.
LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.
LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.
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Table of Contents
Biometrics
Document image inspection
Applications.
Document image inspection
Applications.