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000734077 020__ $$a9781447167419$$qelectronic book
000734077 020__ $$a1447167414$$qelectronic book
000734077 020__ $$z9781447167402
000734077 035__ $$aSP(OCoLC)ocn922324119
000734077 035__ $$aSP(OCoLC)922324119
000734077 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dYDXCP$$dN$T$$dIDEBK$$dGW5XE$$dOCLCF
000734077 049__ $$aISEA
000734077 050_4 $$aTA1634
000734077 08204 $$a006.3/7$$223
000734077 24500 $$aIntegrated imaging and vision techniques for industrial inspection$$h[electronic resource] :$$badvances and applications /$$cZheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli and Kurt Niel, editors.
000734077 264_1 $$aLondon :$$bSpringer,$$c2015.
000734077 300__ $$a1 online resource.
000734077 336__ $$atext$$btxt$$2rdacontent
000734077 337__ $$acomputer$$bc$$2rdamedia
000734077 338__ $$aonline resource$$bcr$$2rdacarrier
000734077 4901_ $$aAdvances in computer vision and pattern recognition
000734077 504__ $$aIncludes bibliographical references and index.
000734077 506__ $$aAccess limited to authorized users.
000734077 588__ $$aOnline resource; title from PDF title page (viewed September 30, 2015).
000734077 650_0 $$aComputer vision$$xIndustrial applications.
000734077 650_0 $$aEngineering inspection.
000734077 7001_ $$aLiu, Zheng,$$eeditor.
000734077 7001_ $$aUkida, Hiroyuki,$$eeditor.
000734077 7001_ $$aRamuhalli, Pradeep,$$eeditor.
000734077 7001_ $$aNiel, Kurt,$$eeditor.
000734077 830_0 $$aAdvances in computer vision and pattern recognition.
000734077 852__ $$bebk
000734077 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-1-4471-6741-9$$zOnline Access$$91397441.1
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000734077 980__ $$aEBOOK
000734077 980__ $$aBIB
000734077 982__ $$aEbook
000734077 983__ $$aOnline
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