TY  - GEN
T1  - Fringe pattern analysis for optical metrologytheory, algorithms, and applications /
AU  - Servín, Manuel,
AU  - Quiroga, J. Antonio,
AU  - Padilla, J. Moises,
CN  - QC415
ID  - 735797
KW  - Diffraction patterns
KW  - Image processing
SN  - 9783527681082
TI  - Fringe pattern analysis for optical metrologytheory, algorithms, and applications /
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10881255
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10881255
ER  -