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000735797 020__ $$z9783527411528
000735797 020__ $$a9783527681082$$qelectronic book
000735797 020__ $$z9783527681105 (ePub)
000735797 020__ $$z9783527681099 (Mobi)
000735797 020__ $$z9783527681075 (oBook)
000735797 035__ $$a(CaPaEBR)ebr10881255
000735797 035__ $$a(OCoLC)881028799
000735797 040__ $$aCaPaEBR$$beng$$erda$$epn$$cCaPaEBR
000735797 05014 $$aQC415$$b.S478 2014eb
000735797 08204 $$a621.36$$223
000735797 1001_ $$aServín, Manuel,$$eauthor.
000735797 24510 $$aFringe pattern analysis for optical metrology$$h[electronic resource] :$$btheory, algorithms, and applications /$$cManuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
000735797 264_1 $$aWeinheim, Germany :$$bWiley-VCH Verlag GmbH & Co. KGaA,$$c2014.
000735797 264_4 $$c©2014
000735797 300__ $$a1 online resource (345 pages) :$$billustrations
000735797 336__ $$atext$$2rdacontent
000735797 337__ $$acomputer$$2rdamedia
000735797 338__ $$aonline resource$$2rdacarrier
000735797 504__ $$aIncludes bibliographical references and index.
000735797 506__ $$aAccess limited to authorized users.
000735797 588__ $$aDescription based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).
000735797 650_0 $$aDiffraction patterns$$xData processing.
000735797 650_0 $$aImage processing$$xData processing.
000735797 7001_ $$aQuiroga, J. Antonio,$$eauthor.
000735797 7001_ $$aPadilla, J. Moises,$$eauthor.
000735797 77608 $$iPrint version:$$aServin, Manuel.$$tFringe pattern analysis for optical metrology : theory, algorithms, and applications.$$dWeinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014 $$z9783527411528
000735797 852__ $$bebk
000735797 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10881255$$zOnline Access
000735797 909CO $$ooai:library.usi.edu:735797$$pGLOBAL_SET
000735797 980__ $$aEBOOK
000735797 980__ $$aBIB
000735797 982__ $$aEbook
000735797 983__ $$aOnline