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Foreword; Preface to the Second Edition; Preface to the First Edition; Contents; Symbols and Abbreviations; 1 Introduction; Abstract; 1.1 General Remarks; 1.2 To the Content of the Book; 1.3 The General Problem; 1.4 One Remark Concerning Conventions; Part I Classical Description of the Interactionof Light with Matter; 2 The Linear Dielectric Susceptibility; Abstract; 2.1 Maxwell's Equations; 2.2 The Linear Dielectric Susceptibility; 2.3 Linear Optical Constants; 2.4 Some General Remarks; 2.5 Example: Orientation Polarization and Debye's Equations; 2.6 Energy Dissipation.
3 The Classical Treatment of Free and Bound Charge CarriersAbstract; 3.1 Free Charge Carriers; 3.1.1 Derivation of Drude's Formula I; 3.1.2 Derivation of Drude's Formula II; 3.2 The Oscillator Model for Bound Charge Carriers; 3.2.1 General Idea; 3.2.2 Microscopic Fields; 3.2.3 The Clausius-Mossotti and Lorentz-Lorenz-Equations; 3.3 Probing Matter in Different Spectral Regions; 3.4 Spatial Dispersion; 3.5 Attempt of an Illustrative Approach; 4 Derivations from the Oscillator Model; Abstract; 4.1 Natural Linewidth; 4.2 Homogeneous and Inhomogeneous Line Broadening Mechanisms; 4.2.1 General.
4.2.2 Collision Broadening4.2.3 Doppler Broadening; 4.2.4 Brendel Model; 4.3 Oscillators with More Than One Degree of Freedom; 4.4 Sellmeier's and Cauchy's Formulae; 4.5 Optical Properties of Mixtures; 4.5.1 Motivation and Example; 4.5.2 The Maxwell Garnett, Bruggeman and Lorentz-Lorenz Mixing Models; 4.5.3 Metal-Dielectric Mixtures and Remarks on Surface Plasmons; 4.5.4 Dielectric Mixtures and Wiener Bounds; 4.5.5 The Effect of Pores; 4.5.6 The Refractive Index of Amorphous Silicon in Terms of the Lorentz-Lorenz Approach: A Model Calculation; 5 The Kramers-Kronig Relations; Abstract.
5.1 Derivation of the Kramers-Kronig Relations5.2 Some Conclusions; 5.3 Resume from Chaps. 2
4 and this Chapter; 5.3.1 Overview on Main Results; 5.3.2 Problems; Part II Interface Reflection and InterferencePhenomena in Thin Film Systems; 6 Planar Interfaces; Abstract; 6.1 Transmission, Reflection, Absorption and Scattering; 6.1.1 Definitions; 6.1.2 Experimental Aspects; 6.1.3 Remarks on the Absorbance Concept; 6.2 The Effect of Planar Interfaces: Fresnel's Formulae; 6.3 Total Reflection of Light; 6.3.1 Conditions of Total Reflection; 6.3.2 Discussion; 6.3.3 Attenuated Total Reflection ATR.
6.4 Metal Surfaces6.4.1 Metallic Reflection; 6.4.2 Propagating Surface Plasmon Polaritons; 6.5 Anisotropic Materials; 6.5.1 Interface Reflection Between an Isotropic and an Anisotropic Material; 6.5.2 Giant Birefringent Optics; 7 Thick Slabs and Thin Films; Abstract; 7.1 Transmittance and Reflectance of a Thick Slab; 7.2 Thick Slabs and Thin Films; 7.3 Spectra of Thin Films; 7.4 Special Cases; 7.4.1 Vanishing Damping; 7.4.2 Halfwave Layers; 7.4.3 Quarterwave Layers; 7.4.4 Free-Standing Films; 7.4.5 A Single Thin Film on a Thick Substrate; 7.4.6 A Few More Words on Reverse Search Procedures.
3 The Classical Treatment of Free and Bound Charge CarriersAbstract; 3.1 Free Charge Carriers; 3.1.1 Derivation of Drude's Formula I; 3.1.2 Derivation of Drude's Formula II; 3.2 The Oscillator Model for Bound Charge Carriers; 3.2.1 General Idea; 3.2.2 Microscopic Fields; 3.2.3 The Clausius-Mossotti and Lorentz-Lorenz-Equations; 3.3 Probing Matter in Different Spectral Regions; 3.4 Spatial Dispersion; 3.5 Attempt of an Illustrative Approach; 4 Derivations from the Oscillator Model; Abstract; 4.1 Natural Linewidth; 4.2 Homogeneous and Inhomogeneous Line Broadening Mechanisms; 4.2.1 General.
4.2.2 Collision Broadening4.2.3 Doppler Broadening; 4.2.4 Brendel Model; 4.3 Oscillators with More Than One Degree of Freedom; 4.4 Sellmeier's and Cauchy's Formulae; 4.5 Optical Properties of Mixtures; 4.5.1 Motivation and Example; 4.5.2 The Maxwell Garnett, Bruggeman and Lorentz-Lorenz Mixing Models; 4.5.3 Metal-Dielectric Mixtures and Remarks on Surface Plasmons; 4.5.4 Dielectric Mixtures and Wiener Bounds; 4.5.5 The Effect of Pores; 4.5.6 The Refractive Index of Amorphous Silicon in Terms of the Lorentz-Lorenz Approach: A Model Calculation; 5 The Kramers-Kronig Relations; Abstract.
5.1 Derivation of the Kramers-Kronig Relations5.2 Some Conclusions; 5.3 Resume from Chaps. 2
4 and this Chapter; 5.3.1 Overview on Main Results; 5.3.2 Problems; Part II Interface Reflection and InterferencePhenomena in Thin Film Systems; 6 Planar Interfaces; Abstract; 6.1 Transmission, Reflection, Absorption and Scattering; 6.1.1 Definitions; 6.1.2 Experimental Aspects; 6.1.3 Remarks on the Absorbance Concept; 6.2 The Effect of Planar Interfaces: Fresnel's Formulae; 6.3 Total Reflection of Light; 6.3.1 Conditions of Total Reflection; 6.3.2 Discussion; 6.3.3 Attenuated Total Reflection ATR.
6.4 Metal Surfaces6.4.1 Metallic Reflection; 6.4.2 Propagating Surface Plasmon Polaritons; 6.5 Anisotropic Materials; 6.5.1 Interface Reflection Between an Isotropic and an Anisotropic Material; 6.5.2 Giant Birefringent Optics; 7 Thick Slabs and Thin Films; Abstract; 7.1 Transmittance and Reflectance of a Thick Slab; 7.2 Thick Slabs and Thin Films; 7.3 Spectra of Thin Films; 7.4 Special Cases; 7.4.1 Vanishing Damping; 7.4.2 Halfwave Layers; 7.4.3 Quarterwave Layers; 7.4.4 Free-Standing Films; 7.4.5 A Single Thin Film on a Thick Substrate; 7.4.6 A Few More Words on Reverse Search Procedures.