000752041 000__ 05452cam\a2200541Ii\4500 000752041 001__ 752041 000752041 005__ 20230306141352.0 000752041 006__ m\\\\\o\\d\\\\\\\\ 000752041 007__ cr\cn\nnnunnun 000752041 008__ 151002s2016\\\\gw\\\\\\ob\\\\001\0\eng\d 000752041 019__ $$a922921888$$a931592746$$a932333503 000752041 020__ $$a9783662477946$$q(electronic book) 000752041 020__ $$a3662477947$$q(electronic book) 000752041 020__ $$z9783662477939 000752041 020__ $$z3662477939 000752041 0247_ $$a10.1007/978-3-662-47794-6$$2doi 000752041 035__ $$aSP(OCoLC)ocn922697834 000752041 035__ $$aSP(OCoLC)922697834$$z(OCoLC)922921888$$z(OCoLC)931592746$$z(OCoLC)932333503 000752041 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dN$T$$dIDEBK$$dOCLCF$$dYDXCP$$dEBLCP$$dCDX$$dUPM$$dCOO$$dGW5XE 000752041 049__ $$aISEA 000752041 050_4 $$aTA1634$$b.B49 2016eb 000752041 08204 $$a006.3/7$$223 000752041 1001_ $$aBeyerer, Jürgen,$$eauthor. 000752041 24510 $$aMachine vision$$h[electronic resource] :$$bautomated visual inspection : theory, practice and applications /$$cJurgen Beyer, Fernando Puente León, Christian Frese. 000752041 264_1 $$aBerlin :$$bSpringer,$$c[2016] 000752041 300__ $$a1 online resource (xx, 798 pages) 000752041 336__ $$atext$$btxt$$2rdacontent 000752041 337__ $$acomputer$$bc$$2rdamedia 000752041 338__ $$aonline resource$$bcr$$2rdacarrier 000752041 504__ $$aIncludes bibliographical references and index. 000752041 5050_ $$aPreface; Contents; Chapter 1 Introduction ; 1 Introduction; 1.1 Visual inspection; 1.2 Optical capturing of test objects; 1.3 Formation and definition of an image ; 1.4 Machine vision; 1.5 Practical approach for performing machine vision projects; 1.6 Bibliography; Part I Image Acquisition ; Chapter 2 Light ; 2 Light; 2.1 The phenomenon of light; 2.1.1 The electromagnetic spectrum; 2.2 Light as an electromagnetic wave; 2.2.1 Maxwell's equations; 2.2.2 Polarization; 2.2.3 Huygens' principle; 2.2.4 Coherence; 2.2.5 Interference; 2.2.6 Diffraction; 2.2.7 Speckle 000752041 5058_ $$a2.3 Light as a quantum phenomenon2.4 The ray model of geometrical optics; 2.5 Summary; 2.6 Interaction of light and matter; 2.6.1 Absorption; 2.6.2 The law of reflection; 2.6.3 The law of refraction; 2.6.4 Scattering; 2.6.5 The Fresnel coefficients for reflection and transmission; 2.6.6 Electromagnetic waves in conductive media; 2.7 Light sources; 2.7.1 Thermal radiators; 2.7.2 Gas-discharge lamps; 2.7.3 Light-emitting diodes; 2.7.4 Laser; 2.7.5 Summary; 2.8 Bibliography; Chapter 3 Optical Imaging ; 3 Optical Imaging; 3.1 Introduction; 3.2 Imaging with a pinhole camera, central projection 000752041 5058_ $$a3.3 The camera model and camera calibration3.4 Optical imaging using a single lens; 3.4.1 The paraxial approximation and Gaussian optics; 3.4.2 Thin lens equation; 3.4.3 Bundle limitation; 3.4.4 Depth of field; 3.4.5 Telecentric imaging; 3.4.6 Perspective; 3.4.7 Imaging of tilted planes; 3.4.8 Aberrations; 3.5 Optical instruments with several lenses; 3.5.1 The projector; 3.5.2 The microscope; 3.6 Bibliography; Chapter 4 Radiometry ; 4 Radiometry; 4.1 Radiometric quantities; 4.2 The light field of a test object; 4.3 The bidirectional reflectance distribution function (BRDF) 000752041 5058_ $$a4.3.1 BRDF and scattered light4.4 Formation of image values; 4.4.1 Application to a thin lens; 4.5 Bibliography; Chapter 5 Color ; 5 Color; 5.1 Photometry; 5.2 Color perception and color spaces; 5.2.1 Color perception of the human eye; 5.2.2 Color mixing; 5.2.3 CIE color spaces; 5.2.4 Spectrophotometry for color measurement and color distance computation; 5.2.5 Color order systems; 5.2.6 Other color spaces; 5.3 Filters; 5.4 Acquisition and processing of color images; 5.5 Bibliography; Chapter 6 Sensors for Image Acquisition ; 6 Sensors for Image Acquisition; 6.1 Point, line and area sensors 000752041 5058_ $$a6.2 Image tube cameras6.3 Photomultipliers; 6.3.1 Image intensifiers; 6.4 Photodiodes; 6.5 Position sensitive detectors (PSD); 6.6 Charge-coupled device (CCD); 6.7 Complementary metal-oxide-semiconductor (CMOS) sensors; 6.8 Line-scan cameras; 6.9 Color sensors and color cameras; 6.10 Infrared cameras; 6.10.1 Bolometer cameras; 6.10.2 Infrared quantum detector cameras; 6.11 Quality criteria for image sensors; 6.12 Bibliography; Chapter 7 Methods of Image Acquisition ; 7 Methods of Image Acquisition; 7.1 Introduction; 7.2 Measuring optical properties 000752041 506__ $$aAccess limited to authorized users. 000752041 520__ $$aThe book offers a thorough introduction to machine vision. It is organized in two parts. The first part covers the image acquisition, which is the crucial component of most automated visual inspection systems. All important methods are described in great detail and are presented with a reasoned structure. The second part deals with the modeling and processing of image signals and pays particular regard to methods, which are relevant for automated visual inspection. 000752041 650_0 $$aComputer vision. 000752041 650_0 $$aComputer vision$$xIndustrial applications. 000752041 650_0 $$aEngineering inspection$$xAutomation. 000752041 650_0 $$aQuality control$$xOptical methods. 000752041 7001_ $$aPuente León, Fernando,$$d1969-$$eauthor. 000752041 7001_ $$aFrese, Christian,$$eauthor. 000752041 77608 $$iPrint version:$$aBeyerer, Jürgen$$tMachine Vision : Automated Visual Inspection: Theory, Practice and Applications$$dBerlin, Heidelberg : Springer Berlin Heidelberg,c2015$$z9783662477939 000752041 852__ $$bebk 000752041 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-47794-6$$zOnline Access$$91397441.1 000752041 909CO $$ooai:library.usi.edu:752041$$pGLOBAL_SET 000752041 980__ $$aEBOOK 000752041 980__ $$aBIB 000752041 982__ $$aEbook 000752041 983__ $$aOnline 000752041 994__ $$a92$$bISE