000752316 000__ 03034cam\a2200517Ii\4500 000752316 001__ 752316 000752316 005__ 20230306141407.0 000752316 006__ m\\\\\o\\d\\\\\\\\ 000752316 007__ cr\cn\nnnunnun 000752316 008__ 151103s2016\\\\gw\a\\\\ob\\\\000\0\eng\d 000752316 019__ $$a927971192$$a933278629$$a936862650 000752316 020__ $$a9783662488232$$q(electronic book) 000752316 020__ $$a366248823X$$q(electronic book) 000752316 020__ $$z9783662488218 000752316 020__ $$z3662488213 000752316 0247_ $$a10.1007/978-3-662-48823-2$$2doi 000752316 035__ $$aSP(OCoLC)ocn927404639 000752316 035__ $$aSP(OCoLC)927404639$$z(OCoLC)927971192$$z(OCoLC)933278629$$z(OCoLC)936862650 000752316 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dN$T$$dYDXCP$$dNUI$$dIDEBK$$dCOO$$dGW5XE$$dAZU$$dOCLCF$$dEBLCP 000752316 049__ $$aISEA 000752316 050_4 $$aTK7836 000752316 08204 $$a621.381$$223 000752316 1001_ $$aZhang, Qingke,$$eauthor. 000752316 24510 $$aInvestigations on microstructure and mechanical properties of the Cu/Pb-free solder joint interfaces$$h[electronic resource] /$$cQingke Zhang. 000752316 264_1 $$aBerlin :$$bSpringer,$$c2016. 000752316 300__ $$a1 online resource :$$bcolor illustrations 000752316 336__ $$atext$$btxt$$2rdacontent 000752316 337__ $$acomputer$$bc$$2rdamedia 000752316 338__ $$aonline resource$$bcr$$2rdacarrier 000752316 347__ $$atext file$$bPDF$$2rda 000752316 4901_ $$aSpringerTheses 000752316 500__ $$a"Doctoral thesis accepted by University of Chinese Academy of Sciences, Beijing, China." 000752316 504__ $$aIncludes bibliographical references. 000752316 5050_ $$aResearch Progress in Pb-free Soldering -- Fracture Behavior of IMCs at Cu/Pb-free Solder Interface -- Tensile-compress Fatigue Behavior of Solder Joints -- Shear Creep-fatigue Behavior of Cu/Pb-free Solder Joints -- Thermal Fatigue Behavior of Sn-Ag/Cu Solder Joints -- Conclusions. 000752316 506__ $$aAccess limited to authorized users. 000752316 520__ $$aThis thesis presents a series of mechanical test methods and comprehensively investigates the deformation and damage behavior of Cu/Pb-free solder joints under different loading conditions. The fracture behavior of Pb-free joint interfaces induced by stress, deformation of solder and substrate are shown, the shear fracture strength of the Cu6Sn5 IMC is measured experimentally for the first time, and the dynamic damage process and microstructure evolution behavior of Pb-free solder joints are revealed intuitively. The thesis puts forward the argument that the local cumulative damage is the major cause of failure in solder joints. The research results provide the experimental and theoretical basis for improving the reliability of solder joints. 000752316 588__ $$aOnline resource; title from PDF title page (viewed November 5, 2015) 000752316 650_0 $$aLead-free electronics manufacturing processes$$xResearch. 000752316 650_0 $$aSolder and soldering$$xDesign and construction. 000752316 650_0 $$aElectronics$$xMaterials. 000752316 77608 $$iPrint version:$$z9783662488218 000752316 830_0 $$aSpringer theses. 000752316 852__ $$bebk 000752316 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-48823-2$$zOnline Access$$91397441.1 000752316 909CO $$ooai:library.usi.edu:752316$$pGLOBAL_SET 000752316 980__ $$aEBOOK 000752316 980__ $$aBIB 000752316 982__ $$aEbook 000752316 983__ $$aOnline 000752316 994__ $$a92$$bISE