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000752488 020__ $$z9783319011738
000752488 020__ $$z3319011731
000752488 020__ $$a9783319011745$$q(electronic book)
000752488 020__ $$a331901174X$$q(electronic book)
000752488 0247_ $$a10.1007/978-3-319-01174-5$$2doi
000752488 035__ $$aSP(OCoLC)ocn929448339
000752488 035__ $$aSP(OCoLC)929448339
000752488 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dIDEBK$$dAZU$$dCOO$$dYDXCP$$dGW5XE
000752488 049__ $$aISEA
000752488 050_4 $$aTK7868.P7
000752488 08204 $$a621.3815310218$$223
000752488 24504 $$aThe boundary-scan handbook$$h[electronic resource] /$$cedited by Kenneth P. Parker.
000752488 250__ $$aFourth edition.
000752488 264_1 $$aBerlin :$$bSpringer,$$c2016.
000752488 300__ $$a1 online resource.
000752488 336__ $$atext$$btxt$$2rdacontent
000752488 337__ $$acomputer$$bc$$2rdamedia
000752488 338__ $$aonline resource$$bcr$$2rdacarrier
000752488 500__ $$aPrevious edition: Boston: Kluwer Academic, 2003.
000752488 5050_ $$aBoundary-Scan Basics And Vocabulary.- Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan.- IEEE 1149.6 Testing Advanced I/O.- IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision.- IEEE 1149.6: The 2015 Revision.
000752488 506__ $$aAccess limited to authorized users.
000752488 520__ $$aAimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers; Explains the new IEEE 1149.8.1 subsidiary standard and applications; Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1 Digital Boundary-Scan IEEE Std 1149.4 Analog Boundary-Scan IEEE Std 1149.6 Advanced I/O Testing IEEE Std 1149.8.1 Passive Component Testing IEEE Std 1149.1-2013 The 2013 Revision of 1149.1 IEEE Std 1532 In-System Configuration IEEE Std 1149.6-2015 The 2015 Revision of 1149.6.
000752488 588__ $$aDescription based on print version record.
000752488 650_0 $$aPrinted circuits$$xTesting.
000752488 650_0 $$aPrinted circuits$$xTesting$$xStandards.
000752488 650_0 $$aBoundary scan testing.
000752488 650_0 $$aElectronic digital computers$$xCircuits$$xDesign and construction.
000752488 7001_ $$aParker, Kenneth P.,$$eeditor.
000752488 77608 $$iPrint version:$$tBoundary-scan handbook.$$bFourth edition$$z9783319011738$$w(OCoLC)871306503
000752488 852__ $$bebk
000752488 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-01174-5$$zOnline Access$$91397441.1
000752488 909CO $$ooai:library.usi.edu:752488$$pGLOBAL_SET
000752488 980__ $$aEBOOK
000752488 980__ $$aBIB
000752488 982__ $$aEbook
000752488 983__ $$aOnline
000752488 994__ $$a92$$bISE