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Preface; Contents; Contributors; 1 Modelling of Heterostructures for Low Dimensional Devices; Abstract; 1.1 Introduction; 1.2 Issues in Modelling of Electronic Structure in Heterostructures; 1.2.1 Interface Strain Effects in Heterostructures; 1.2.2 Composition Effects in Heterostructures; 1.3 Semiempirical Tight Binding Modeling of Heterostructures; 1.3.1 Semiempirical Sp3 Tight Binding Modeling; 1.3.2 Semiempirical Sp3s* Tight Binding Modeling; 1.3.3 Semiempirical Sp3d5s* Tight Binding Modeling; 1.3.4 Semiempirical Sp3d5 Tight Binding Modeling.
1.4 Density Functional Theory Modelling of Heterostructures1.5 Modeling of Band Offsets in Heterostructures; 1.6 Conclusion; References; 2 Aspects of the Modeling of Low Dimensional Quantum Systems; Abstract; 2.1 Introduction; 2.2 3D Harmonic Oscillator with a Superposed Quantum Dot (Fig. 2.1); 2.3 Double Quantum Dot Systems in Low Dimensions; 2.4 Quantum Wire on a 2D Sheet in a Uniform Magnetic Field; 2.5 Inverse Dielectric Function of a Periodic Superlattice; 2.6 An Impenetrable Barrier: Quantum Particle Dynamics in a Highly Singular 1D-Potential; References.
3 Wave Propagation and Diffraction Through a Subwavelength Nano-Hole in a 2D Plasmonic ScreenAbstract; 3.1 Introduction; 3.2 Scalar Green's Function for a 2D Plasmonic Layer with a Nano-Hole Aperture Embedded in a 3D Bulk Host Medium; 3.3 Scalar Field Response of a Perforated 2D Plasmonic Layer to an Incident Wave {\bf U_{0}} {\bf (r, \omega)} : Transmission; 3.4 Numerical Analysis of Helmholtz Scalar Wave Propagation in the Vicinity of a Perforated Plasmonic Layer with a Nano-Hole; 3.5 Summary; Acknowledgments; References; 4 The Challenge to Develop Metrology at the Nanoscale; Abstract.
4.1 Metrology4.2 Nanotechnology Generations, Definitions, and Visions; 4.3 Nanotechnology Research Drives; 4.3.1 The Semiconductor Industry; 4.3.2 The Healthcare Industry; 4.4 Nanotechnology Artefacts; 4.5 Nanomaterials Measurement Challenges; 4.6 Nanomaterials Instruments; 4.6.1 Spectroscopic Ellipsometry (SE); 4.6.1.1 Main Measurement Uncertainty Contributions; 4.6.2 Metrological AFM; 4.6.2.1 Main Measurement Uncertainty Contributions; 4.6.3 Scanning Electron Microscopy (SEM); 4.6.3.1 Main Measurement Uncertainty Contributions; 4.7 Other Methods for Dimensional Nanometrology.
4.7.1 X-ray Interferometry (XRI)4.7.2 Small Angle X-ray Scattering Diffractometer (SAXS); 4.7.3 Electron/X-ray Diffraction; 4.7.4 Raman Spectroscopy as a Nanometrology Tool; 4.8 The Challenge for Nanometrology; 4.9 Conclusion; Acknowledgments; References; 5 Terahertz Devices and Systems for the Spectroscopic Analysis of Biomolecules
``Complexity Great and Small''; Abstract; 5.1 Introduction; 5.2 THz Time Domain Spectroscopy; 5.3 Small Complexity
Simple Polar Liquids; 5.4 Great Complexity
Proteins; 5.5 Conclusions; References; 6 Recent Progress in XAFS Study for Semiconducting Thin Films.
1.4 Density Functional Theory Modelling of Heterostructures1.5 Modeling of Band Offsets in Heterostructures; 1.6 Conclusion; References; 2 Aspects of the Modeling of Low Dimensional Quantum Systems; Abstract; 2.1 Introduction; 2.2 3D Harmonic Oscillator with a Superposed Quantum Dot (Fig. 2.1); 2.3 Double Quantum Dot Systems in Low Dimensions; 2.4 Quantum Wire on a 2D Sheet in a Uniform Magnetic Field; 2.5 Inverse Dielectric Function of a Periodic Superlattice; 2.6 An Impenetrable Barrier: Quantum Particle Dynamics in a Highly Singular 1D-Potential; References.
3 Wave Propagation and Diffraction Through a Subwavelength Nano-Hole in a 2D Plasmonic ScreenAbstract; 3.1 Introduction; 3.2 Scalar Green's Function for a 2D Plasmonic Layer with a Nano-Hole Aperture Embedded in a 3D Bulk Host Medium; 3.3 Scalar Field Response of a Perforated 2D Plasmonic Layer to an Incident Wave {\bf U_{0}} {\bf (r, \omega)} : Transmission; 3.4 Numerical Analysis of Helmholtz Scalar Wave Propagation in the Vicinity of a Perforated Plasmonic Layer with a Nano-Hole; 3.5 Summary; Acknowledgments; References; 4 The Challenge to Develop Metrology at the Nanoscale; Abstract.
4.1 Metrology4.2 Nanotechnology Generations, Definitions, and Visions; 4.3 Nanotechnology Research Drives; 4.3.1 The Semiconductor Industry; 4.3.2 The Healthcare Industry; 4.4 Nanotechnology Artefacts; 4.5 Nanomaterials Measurement Challenges; 4.6 Nanomaterials Instruments; 4.6.1 Spectroscopic Ellipsometry (SE); 4.6.1.1 Main Measurement Uncertainty Contributions; 4.6.2 Metrological AFM; 4.6.2.1 Main Measurement Uncertainty Contributions; 4.6.3 Scanning Electron Microscopy (SEM); 4.6.3.1 Main Measurement Uncertainty Contributions; 4.7 Other Methods for Dimensional Nanometrology.
4.7.1 X-ray Interferometry (XRI)4.7.2 Small Angle X-ray Scattering Diffractometer (SAXS); 4.7.3 Electron/X-ray Diffraction; 4.7.4 Raman Spectroscopy as a Nanometrology Tool; 4.8 The Challenge for Nanometrology; 4.9 Conclusion; Acknowledgments; References; 5 Terahertz Devices and Systems for the Spectroscopic Analysis of Biomolecules
``Complexity Great and Small''; Abstract; 5.1 Introduction; 5.2 THz Time Domain Spectroscopy; 5.3 Small Complexity
Simple Polar Liquids; 5.4 Great Complexity
Proteins; 5.5 Conclusions; References; 6 Recent Progress in XAFS Study for Semiconducting Thin Films.