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Hard x-ray photoelectron spectroscopy (HAXPES) [electronic resource] / Joseph C. Woicik, editor.

Woicik, Joseph C., editor.
2016
QC454.P48
Available Online
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Title
Hard x-ray photoelectron spectroscopy (HAXPES) [electronic resource] / Joseph C. Woicik, editor.
ISBN
9783319240435 (electronic book)
3319240439 (electronic book)
3319240412
9783319240411
DOI
https://doi.org/10.1007/978-3-319-24043-5
Published
Cham : Springer, 2016.
Language
English
Description
1 online resource (xii, 571 pages) : illustrations.
Item Number
10.1007/978-3-319-24043-5 doi
Call Number
QC454.P48
Dewey Decimal Classification
543/.62
Summary
This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.
Note
Includes index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed January 7, 2016).
Added Author
Woicik, Joseph C., editor.
Series
Springer series in surface sciences ; 59.
Available in Other Form
Print version: 9783319240411
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Overview
Early Work and SSRP
Instrumentation and Spin Resolved
Theory
Inelastic Mean Free Path
Final State Effects
Recoil Effects
Atomic and Molecular
Angle Resolved
Valence Density of States
Diffraction
Advanced Materials
Correlated Materials
Perovskite Interfaces and Superlattices
Heusler Compounds
In-Situ Surface Chemistry
Heterojunction Band Alignment
Semiconductor Electronics
Photoelectron Imaging
Time Resolved.

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