@article{754830,
      recid = {754830},
      author = {Yuan, J. S.,},
      title = {CMOS RF circuit design for reliability and variability  [electronic resource] /},
      pages = {1 online resource (vi, 106 pages) :},
      abstract = {The subject of this book is CMOS RF circuit design for  reliability. The device reliability and process variation  issues on RF transmitter and receiver circuits will be  particular interest to the readers in the field of  semiconductor devices and circuits. This proposed book is  unique to explore typical reliability issues in the device  and technology level and then to examine their impact on RF  wireless transceiver circuit performance. Analytical  equations, experimental data, device and circuit simulation  results will be given for clear explanation. The main  benefit the reader derive from this book will be clear  understanding on how device reliability issues affects the  RF circuit performance subjected to operation aging and  process variations.},
      url = {http://library.usi.edu/record/754830},
      doi = {https://doi.org/10.1007/978-981-10-0884-9},
}