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000754830 020__ $$a9789811008849$$q(electronic book)
000754830 020__ $$a9811008841$$q(electronic book)
000754830 020__ $$z9789811008825
000754830 0247_ $$a10.1007/978-981-10-0884-9$$2doi
000754830 035__ $$aSP(OCoLC)ocn946724658
000754830 035__ $$aSP(OCoLC)946724658
000754830 040__ $$aN$T$$beng$$erda$$epn$$cN$T$$dGW5XE$$dN$T$$dOCLCO$$dIDEBK$$dYDXCP$$dAZU$$dOCLCF$$dOCLCO$$dEBLCP$$dCOO
000754830 049__ $$aISEA
000754830 050_4 $$aTK7874.78
000754830 08204 $$a621.3815$$223
000754830 1001_ $$aYuan, J. S.,$$eauthor.
000754830 24510 $$aCMOS RF circuit design for reliability and variability$$h[electronic resource] /$$cJiann-Shiun Yuan.
000754830 264_1 $$aSingapore :$$bSpringer,$$c2016.
000754830 300__ $$a1 online resource (vi, 106 pages) :$$billustrations.
000754830 336__ $$atext$$btxt$$2rdacontent
000754830 337__ $$acomputer$$bc$$2rdamedia
000754830 338__ $$aonline resource$$bcr$$2rdacarrier
000754830 4901_ $$aSpringerBriefs in applied sciences and technology, Reliability,$$x2191-530X
000754830 504__ $$aIncludes bibliographical references.
000754830 5050_ $$aCMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
000754830 506__ $$aAccess limited to authorized users.
000754830 520__ $$aThe subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
000754830 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed April 19, 2016).
000754830 650_0 $$aRadio frequency integrated circuits$$xDesign and construction.
000754830 650_0 $$aMetal oxide semiconductors, Complementary$$xDesign and construction.
000754830 77608 $$iPrint version:$$z9789811008825
000754830 830_0 $$aSpringerBriefs in applied sciences and technology.$$pReliability.
000754830 852__ $$bebk
000754830 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-10-0884-9$$zOnline Access$$91397441.1
000754830 909CO $$ooai:library.usi.edu:754830$$pGLOBAL_SET
000754830 980__ $$aEBOOK
000754830 980__ $$aBIB
000754830 982__ $$aEbook
000754830 983__ $$aOnline
000754830 994__ $$a92$$bISE