TY  - GEN
N2  - The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .
AB  - The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .
T1  - Metrology and physical mechanisms in new generation ionic devices
AU  - Celano, Umberto,
CN  - QC176.83
N1  - "Doctoral thesis accepted by the KU Leuven and IMEC, Belgium."
ID  - 755984
KW  - Thin films.
KW  - Electronic apparatus and appliances.
KW  - Metrology.
KW  - Nonvolatile random-access memory.
SN  - 9783319395319
SN  - 3319395319
TI  - Metrology and physical mechanisms in new generation ionic devices
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-39531-9
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-39531-9
ER  -