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000755984 020__ $$a9783319395319$$q(electronic book)
000755984 020__ $$a3319395319$$q(electronic book)
000755984 020__ $$z9783319395302
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000755984 08204 $$a621.3815/2$$22
000755984 1001_ $$aCelano, Umberto,$$eauthor.
000755984 24510 $$aMetrology and physical mechanisms in new generation ionic devices$$h[electronic resource] /$$cUmberto Celano.
000755984 264_1 $$aSwitzerland :$$bSpringer,$$c2016.
000755984 300__ $$a1 online resource (xxiv, 175 pages) :$$billustrations.
000755984 336__ $$atext$$btxt$$2rdacontent
000755984 337__ $$acomputer$$bc$$2rdamedia
000755984 338__ $$aonline resource$$bcr$$2rdacarrier
000755984 4901_ $$aSpringer theses
000755984 500__ $$a"Doctoral thesis accepted by the KU Leuven and IMEC, Belgium."
000755984 504__ $$aIncludes bibliographical references.
000755984 5050_ $$aIntroduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. .
000755984 506__ $$aAccess limited to authorized users.
000755984 520__ $$aThe thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .
000755984 588__ $$aOnline resource; title from PDF title page (SpringerLink, viewed June 28, 2016).
000755984 650_0 $$aThin films.
000755984 650_0 $$aElectronic apparatus and appliances.
000755984 650_0 $$aMetrology.
000755984 650_0 $$aNonvolatile random-access memory.
000755984 77608 $$iPrint version:$$aCelano, Umberto.$$tMetrology and physical mechanisms in new generation ionic devices : Doctoral Thesis accepted by the KU Leuven and IMEC, Belgium.$$d[Cham], Switzerland : Springer, c2016$$z9783319395302$$w(DLC)  2016940821
000755984 830_0 $$aSpringer theses.
000755984 852__ $$bebk
000755984 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-39531-9$$zOnline Access$$91397441.1
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