TY - GEN N2 - This book introduces the basic framework of advanced focal plane technology based on the third-generation infrared focal plane concept. The essential concept, research advances, and future trends in advanced sensor arrays are comprehensively reviewed. Moreover, the book summarizes recent research advances in HgCdTe/AlGaN detectors for the infrared/ultraviolet waveband, with a particular focus on the numerical method of detector design, material epitaxial growth and processing, as well as Complementary Metal-Oxide-Semiconductor Transistor readout circuits. The book offers a unique resource for all graduate students and researchers interested in the technologies of focal plane arrays or electro-optical imaging sensors. DO - 10.1007/978-3-662-52718-4 DO - doi AB - This book introduces the basic framework of advanced focal plane technology based on the third-generation infrared focal plane concept. The essential concept, research advances, and future trends in advanced sensor arrays are comprehensively reviewed. Moreover, the book summarizes recent research advances in HgCdTe/AlGaN detectors for the infrared/ultraviolet waveband, with a particular focus on the numerical method of detector design, material epitaxial growth and processing, as well as Complementary Metal-Oxide-Semiconductor Transistor readout circuits. The book offers a unique resource for all graduate students and researchers interested in the technologies of focal plane arrays or electro-optical imaging sensors. T1 - Technology for advanced focal plane arrays of HgCdTe and AlGaN AU - He, Li, AU - Yang, Dingjiang, AU - Ni, Guoqiang, CN - TA1573 LA - eng N1 - "Translation from the Chinese language edition: Introduciton to advanced focal plane by Li He." ID - 756481 KW - Infrared array detectors. KW - Focal planes. KW - Electrooptical devices. SN - 9783662527184 SN - 3662527189 TI - Technology for advanced focal plane arrays of HgCdTe and AlGaN LK - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-52718-4 UR - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-662-52718-4 ER -