Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.
Gray, Kirk, author.; Paschkewitz, John James, author.
2016
TA169.3 .G73 2016eb
Available Online

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Title
Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.
Author
Gray, Kirk, author.
ISBN
9781118700235
9781118700228
9781118700204 (electronic book)
Published
Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
Language
English
Description
1 online resource (299 pages) : illustrations.
Call Number
TA169.3 .G73 2016eb
Dewey Decimal Classification
621.381028/7
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Description based on print version record.
Added Author
Paschkewitz, John James, author.
Series
Wiley series in quality and reliability engineering.
Available in Other Form
Next generation HALT and HASS : robust design of electronics and systems.
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Basis and limitations of typical current reliability methods & metrics
The need for reliability assurance metrics to change
Challenges to advancing electronics reliability engineering
A new deterministic reliability development paradigm
Common understanding of HALT approach is critical for success
The fundamentals of HALT
Highly accelerated stress screening (HALT) and audits (HASA)
HALT benefits for software/firmware performance and reliability
Quantitative accelerated life test
Failure analysis and corrective action
Additional applications of HALT methods.

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