000773940 000__ 02337cam\a2200445\i\4500
000773940 001__ 773940
000773940 005__ 20210515124058.0
000773940 006__ m\\\\\o\\d\\\\\\\\
000773940 007__ cr\cn\nnnunnun
000773940 008__ 140722t20142014sz\a\\\\ob\\\\001\0\eng\d
000773940 020__ $$z9783038351382
000773940 020__ $$a9783038265214$$q(electronic book)
000773940 035__ $$a(CaPaEBR)ebr10895068
000773940 035__ $$a(OCoLC)889266038
000773940 040__ $$aCaPaEBR$$beng$$erda$$epn$$cCaPaEBR
000773940 05014 $$aTA165$$b.I584 2014eb
000773940 08204 $$a681.2$$223
000773940 1112_ $$aInternational Conference on Measurement, Instrumentation and Automation$$n(3rd :$$d2014 :$$cShanghai, China)
000773940 24510 $$aMeasurement technology and its application III :$$bselected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China /$$cedited by Prasad Yarlagadda and Yun-Hae Kim.
000773940 2461_ $$aICMIA 2014
000773940 264_1 $$aZurich, Switzerland :$$bTTP,$$c2014.
000773940 264_4 $$c©2014
000773940 300__ $$a1 online resource (2012 pages) :$$billustrations.
000773940 336__ $$atext$$2rdacontent
000773940 337__ $$acomputer$$2rdamedia
000773940 338__ $$aonline resource$$2rdacarrier
000773940 4901_ $$aApplied Mechanics and Materials,$$x1662-7482 ;$$vVolume 568-570
000773940 504__ $$aIncludes bibliographical references and indexes..
000773940 506__ $$aAccess limited to authorized users.
000773940 588__ $$aDescription based on online resource; title from PDF title page (ebrary, viewed July 22, 2014).
000773940 650_0 $$aDetectors$$vCongresses.
000773940 650_0 $$aMeasurement$$vCongresses.
000773940 650_0 $$aMeasuring instruments$$vCongresses.
000773940 7001_ $$aYarlagadda, Prasad,$$eeditor.
000773940 7001_ $$aKim, Yun-Hae,$$eeditor.
000773940 77608 $$iPrint version:$$aInternational Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China)$$tMeasurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China.$$dZurich, Switzerland : TTP, c2014 $$z9783038351382
000773940 830_0 $$aApplied mechanics and materials ;$$vVolume 568-570.
000773940 852__ $$bebk
000773940 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10895068$$zOnline Access
000773940 909CO $$ooai:library.usi.edu:773940$$pGLOBAL_SET
000773940 980__ $$aEBOOK
000773940 980__ $$aBIB
000773940 982__ $$aEbook
000773940 983__ $$aOnline