@article{777735,
      recid = {777735},
      author = {Zuo, Jian Min, and Spence, John C. H.,},
      title = {Advanced transmission electron microscopy : imaging and  diffraction in nanoscience /},
      pages = {1 online resource (xxvi, 729 pages) :},
      abstract = {This volume expands and updates the coverage in the  authors' classic 1992 book, "Electron Microdiffraction." As  the title implies, the focus of the book has changed from  electron microdiffraction, or convergent beam electron  diffraction, to electron nanodiffraction and the  applications of electron diffraction from single crystals  as well as general structure analysis of single crystals,  powders, and nanostructures. Advanced Transmission Electron  Microscopy provides a comprehensive treatment of theory and  practice, and is written at a level suitable for advanced  undergraduate students and graduate students and  researchers in materials science, chemistry, and physics.  Practical guides are provided for interpretation and  simulation of electron diffraction patterns.},
      url = {http://library.usi.edu/record/777735},
      doi = {https://doi.org/10.1007/978-1-4939-6607-3},
}