000777735 000__ 03261cam\a2200517Mi\4500 000777735 001__ 777735 000777735 005__ 20230306142731.0 000777735 006__ m\\\\\o\\d\\\\\\\\ 000777735 007__ cr\nn\nnnunnun 000777735 008__ 161026s2017\\\\nyua\\\\ob\\\\001\0\eng\d 000777735 019__ $$a965517874$$a974649708$$a981030326 000777735 020__ $$a9781493966073$$q(electronic book) 000777735 020__ $$a1493966073$$q(electronic book) 000777735 020__ $$z9781493966059 000777735 0247_ $$a10.1007/978-1-4939-6607-3$$2doi 000777735 035__ $$aSP(OCoLC)ocn962017350 000777735 035__ $$aSP(OCoLC)962017350$$z(OCoLC)965517874$$z(OCoLC)974649708$$z(OCoLC)981030326 000777735 040__ $$aAZU$$beng$$epn$$cAZU$$dGW5XE$$dOCLCO$$dOCLCQ$$dYDX$$dOCLCF$$dUAB$$dUPM$$dVT2$$dIOG 000777735 049__ $$aISEA 000777735 050_4 $$aTA404.6 000777735 08204 $$a502.8/25$$223 000777735 1001_ $$aZuo, Jian Min,$$eauthor. 000777735 24510 $$aAdvanced transmission electron microscopy :$$bimaging and diffraction in nanoscience /$$cJian Min Zuo, John C.H. Spence. 000777735 264_1 $$aNew York, NY :$$bSpringer,$$c©2017. 000777735 300__ $$a1 online resource (xxvi, 729 pages) :$$billustrations. 000777735 336__ $$atext$$btxt$$2rdacontent 000777735 337__ $$acomputer$$bc$$2rdamedia 000777735 338__ $$aonline resource$$bcr$$2rdacarrier 000777735 347__ $$atext file$$bPDF$$2rda 000777735 504__ $$aIncludes bibliographical references and indexes. 000777735 5050_ $$aIntroduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes. 000777735 506__ $$aAccess limited to authorized users. 000777735 520__ $$aThis volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns. 000777735 650_0 $$aTransmission electron microscopy. 000777735 650_0 $$aMaterials science. 000777735 650_0 $$aNanochemistry. 000777735 650_0 $$aSolid state physics. 000777735 650_0 $$aNanoscience. 000777735 650_0 $$aNanostructures. 000777735 650_0 $$aNanotechnology. 000777735 7001_ $$aSpence, John C. H.,$$eauthor. 000777735 77608 $$iPrint version:$$z9781493966059 000777735 852__ $$bebk 000777735 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-1-4939-6607-3$$zOnline Access$$91397441.1 000777735 909CO $$ooai:library.usi.edu:777735$$pGLOBAL_SET 000777735 980__ $$aEBOOK 000777735 980__ $$aBIB 000777735 982__ $$aEbook 000777735 983__ $$aOnline 000777735 994__ $$a92$$bISE