TY  - GEN
N2  - This proceedings volume contains selected revised and extended research articles written by researchers who participated in the World Congress on Engineering and Computer Science 2015, held in San Francisco, USA, 21-23 October 2015. Topics covered include engineering mathematics, electrical engineering, circuits, communications systems, computer science, chemical engineering, systems engineering, manufacturing engineering, and industrial applications. The book offers the reader an overview of the state of the art in engineering technologies, computer science, systems engineering and applications, and will serve as an excellent reference work for researchers and graduate students working in these fields.
DO  - 10.1007/978-981-10-2717-8
DO  - doi
AB  - This proceedings volume contains selected revised and extended research articles written by researchers who participated in the World Congress on Engineering and Computer Science 2015, held in San Francisco, USA, 21-23 October 2015. Topics covered include engineering mathematics, electrical engineering, circuits, communications systems, computer science, chemical engineering, systems engineering, manufacturing engineering, and industrial applications. The book offers the reader an overview of the state of the art in engineering technologies, computer science, systems engineering and applications, and will serve as an excellent reference work for researchers and graduate students working in these fields.
T1  - Transactions on engineering technologies :World Congress on Engineering and Computer Science 2015 /
AU  - Ao, Sio-Iong,
AU  - Kim, Haeng-Kon,
AU  - Amouzegar, Mahyar A.,
CN  - TA5
N1  - Includes indexes.
ID  - 779441
KW  - Engineering
KW  - Computer science
KW  - Technology
SN  - 9789811027178
SN  - 981102717X
TI  - Transactions on engineering technologies :World Congress on Engineering and Computer Science 2015 /
LK  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-10-2717-8
UR  - https://univsouthin.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-981-10-2717-8
ER  -